Ferroelectric Data Retention Control Circuit Testing

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Solution Overview

Problem

Conventional data retention control circuits using ferroelectric devices face challenges in precisely testing the characteristics of ferroelectric storage parts due to unintended data recording and potential differences affecting the accuracy of the test results.

Innovation Solution

The proposed data retention control circuit includes a data retention part with logic circuits and ferroelectric storage parts, along with transmission control and test voltage supply control parts, which allow for precise control and testing of logic signals and storage data, preventing unintended data recording and improving the precision of ferroelectric device characterization.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If conventional data retention control circuits use ferroelectric devices for data retention, then data can be retained after power cutoff, but unintended data recording occurs during testing and measurement precision deteriorates

Engineering Contradiction:

Improvedata retention capabilityVSAvoidferroelectric device characteristics testing accuracy

Core Design Contradiction:

ReliabilityVSMeasurement precision

Solution Approach 1:

The circuit is divided into distinct functional segments: a data retention circuit for normal operation and a test circuit for characterization. The test circuit includes separate test signal input terminals and test voltage supply terminals that are isolated from the normal data input paths. This segmentation allows independent testing of ferroelectric device characteristics without interference from normal data retention operations, eliminating unintended data recording during tests.

Inventive Principle:

Principle #1Segmentation

Solution Approach 2:

Dedicated intermediary components are introduced for testing purposes: test signal input terminals serve as intermediaries between external test equipment and the ferroelectric storage part, while test voltage supply terminals act as intermediaries for applying test voltages. These intermediaries provide controlled access to the ferroelectric device during testing, preventing unwanted signal coupling from normal data paths and ensuring accurate measurement of characteristics such as hysteresis curves.

Inventive Principle:

Principle #24Intermediary (Mediator)

2Reliability

If transmission control circuits are used to control signal transmission to ferroelectric parts, then data retention is improved, but circuit complexity increases

Engineering Contradiction:

Improvedata retention control precisionVSAvoidtransmission control circuit structure

Core Design Contradiction:

ReliabilityVSDevice complexity

Solution Approach 1:

The transmission control functionality is segmented into dedicated control circuits: a first transmission control circuit specifically for controlling data signals to the ferroelectric storage part, and a second transmission control circuit for controlling test signals. Each control circuit manages specific transmission paths independently, providing precise control for data retention while maintaining clear separation from test operations, thus avoiding unnecessary complexity in the overall system.

Inventive Principle:

Principle #1Segmentation

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This solution enables more precise testing of ferroelectric device characteristics, reducing errors and enhancing the accuracy of data retention and reading operations in semiconductor chips.

Implementation Method 1

The ferroelectric device C11 retains a logic level of the logic signal Nout11 as storage data KD11

Methodology Applied

Scientific EffectFerroelectric effect:

Data Source

PatentUS9601177B2Data retention control circuit, data writing method, data reading method, method of testing characteristics of ferroelectric storage device, and semiconductor chip

Publication Date: 2017.03.21 ROHM CO LTD

AI summary

A data retention control circuit includes a data retention part having first and second logic circuits, a ferroelectric storage part having first and second ferroelectric device parts, first and second transmission control parts, and a test voltage supply control part. The first transmission control part has first and second transmission control circuits controlling first and second logic signals to the first and second ferroelectric device parts, respectively. The second transmission control part has third and fourth transmission control circuits controlling transmission of first and second storage data from the first and second ferroelectric device part to the second and first logic circuits, respectively. The test voltage supply control part has first and second test voltage supply control circuits controlling supplies of first and second test voltages to the second and first logic circuit, respectively.