Flash Memory Controller Dynamic Error Correction
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Solution Overview
Problem
As integration density increases in flash memory cells, interference between cells worsens, leading to a broader threshold voltage distribution and increased error rates during data reading, which affects the accuracy and speed of data retrieval.
Innovation Solution
A semiconductor device and method that utilize health monitoring data to optimize error correction by adjusting the number of read operations and decoding repetitions based on threshold voltage distribution information, thereby reducing power consumption and improving error correction speed.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If the number of decoding operations is increased to improve error correction accuracy, then the error correction capability is improved, but the power consumption increases and the correction speed decreases
Solution Approach 1:
The patent implements dynamic adjustment of the decoding operation count based on real-time threshold voltage distribution characteristics. The controller monitors the health monitoring data and dynamically determines the number of times to repeat the decoding operation, rather than using a fixed predetermined number. This dynamic approach allows the system to perform more decoding operations when error rates are high (improving reliability) while performing fewer operations when error rates are low (reducing power consumption), thus resolving the contradiction between error correction capability and power consumption.
2Reliability
If the number of decoding operations is increased to improve error correction accuracy, then the error correction capability is improved, but the error correction speed decreases
Solution Approach 1:
The system dynamically adjusts the decoding operation count based on threshold voltage distribution characteristics. When the distribution width is large indicating high error rates, the system increases the number of decoding operations to ensure accurate correction. When the distribution width is small indicating low error rates, the system reduces the number of operations to maintain fast correction speed. This dynamic adaptation resolves the contradiction between error correction capability and correction speed.
3Use of energy by moving object
If health monitoring data is utilized to dynamically adjust decoding operations, then power consumption and correction speed are optimized, but the device complexity increases
Solution Approach 1:
The patent incorporates a feedback mechanism where the controller continuously monitors health monitoring data including threshold voltage distribution characteristics and uses this feedback to adjust the number of decoding operations. The controller receives feedback about the memory device's health status and dynamically modifies its operation accordingly. This feedback-based approach optimizes power consumption and correction speed while the added complexity is confined to the control logic, which manages the decoding process based on real-time conditions.
Data Source
AI summary
A semiconductor device includes a memory device suitable for outputting health monitoring data including information on a threshold voltage distribution, and outputting read data read from memory cells included in the memory device, and a controller suitable for receiving a predetermined quantity of the read data from the memory device based on the health monitoring data, and performing a decoding operation for an error correction by using the received read data.