Multi-Chip Flash Memory Parallel Status Data Reading

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Solution Overview

Problem

In multi-chip flash memory devices, frequent requests for ready/busy signals from multiple memory chips lead to prolonged standby times, hindering fast interleaved programming operations and degrading the operation rate of the memory system.

Innovation Solution

A method where a single command is used to request and receive ready/busy status data from all memory chips simultaneously through different channels, allowing the status signals to be output in parallel via specifically assigned input/output pins, reducing the need for individual requests and outputs.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If ready/busy signals are requested from each memory chip individually in time-divisional mode, then each chip can be monitored, but the standby time is prolonged and operation rate is degraded

Engineering Contradiction:
Improvestatus monitoring accuracyVSAvoidoperation rate
Core Design Contradiction:
Measurement precisionVSProductivity

Solution Approach 1:

The patent merges the status monitoring of multiple memory chips into a single parallel operation. Instead of sequentially requesting ready/busy signals from each chip (time-divisional mode), the invention enables simultaneous monitoring of all chips by assigning each chip a dedicated I/O pin for status output, allowing the host to receive status data from all chips in parallel, thus dramatically reducing standby time and improving operation rate

Inventive Principle:
Principle #5Merging (Combining)

2Reliability

If frequent requests for ready/busy signals are made to check programming operations, then operation states can be monitored, but time consumption increases

Engineering Contradiction:
Improveoperation state monitoringVSAvoidstandby time
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The patent enables continuous and simultaneous monitoring of all memory chips without interruption. By assigning dedicated I/O pins to each chip for status signal output, the host can continuously receive ready/busy signals from all chips in parallel, eliminating the sequential waiting time inherent in time-divisional monitoring, thus maintaining reliable operation state monitoring while minimizing time loss

Inventive Principle:
Principle #20Continuity of useful action

3Ease of operation

If time-divisional mode is used for command provision and signal output, then chip identification is simplified, but the speed of confirming ready/busy status is reduced

Engineering Contradiction:
Improvecommand managementVSAvoidstatus confirmation speed
Core Design Contradiction:
Ease of operationVSSpeed

Solution Approach 1:

The patent segments the I/O pins to create dedicated status output channels for each memory chip. Each chip is assigned a specific I/O pin for ready/busy signal output, allowing simultaneous independent monitoring of all chips. This segmentation enables parallel status confirmation while maintaining simple command management through the memory controller's ability to address each chip individually

Inventive Principle:
Principle #1Segmentation

Data Source

PatentUS7843758B2Multi-chip package flash memory device and method for reading status data therefrom
Publication Date: 2010.11.30 SAMSUNG ELECTRONICS CO LTD
  • US7843758B2 patent drawing
  • US7843758B2 patent drawing
  • US7843758B2 patent drawing

AI summary

A method for reading status data from a multi-chip memory device including pluralities of memory chips is comprised of: providing a command to request an output of the status data to the plurality of memory chips; and accepting the status data of the plurality of memory chips through multiple channels of the multi-chip memory device. The reading method of the status data is helpful to shortening a standby time for accepting the status data of the multi-chip memory device, enhancing an operation rate.