Flat Glass Particle Detection Using Polarized Light Segmentation
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Solution Overview
Problem
Existing methods for inspecting flat glass, such as bright field and dark field optical systems, fail to accurately distinguish between particles that affect the quality of flat glass, like metal and ceramic components, and those that do not, such as bubble components, making it difficult to determine the impact of defects on glass quality.
Innovation Solution
An apparatus and method using polarized light with specific polarizer orientations to differentiate between benign and malignant particles in flat glass, where polarized light is irradiated and images are captured using cameras with polarizers aligned at different angles, allowing a processor to determine the nature of defects based on image comparison.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If bright field or dark field optical systems are used to detect particles in flat glass, then the exact position of defects can be easily perceived, but it is hard to decide whether the defects largely affect the glass quality or not
Solution Approach 1:
The patent segments the detection process into multiple channels with different polarizer orientations (0°-20°, 70°-90°, and other orientations). Each channel captures specific particle characteristics, allowing the system to both locate particles precisely and identify their types by comparing the segmented detection results across different polarization angles.
Solution Approach 2:
The patent introduces a new dimension of detection by utilizing polarization angle as an additional parameter. Instead of relying solely on spatial position detection, the system adds polarization orientation as a dimensional variable, enabling particle type identification while maintaining position detection accuracy through multi-dimensional data analysis.
2Measurement precision
If multiple polarizers with different orientations are used to distinguish particle types, then particle classification accuracy is improved, but the device complexity increases
Solution Approach 1:
The patent designs a multi-functional optical detection system where a single apparatus performs both position detection and particle type classification simultaneously. By integrating multiple polarizer orientations and detection channels into one universal system, the patent avoids the need for separate detection devices, thereby improving particle classification accuracy while controlling overall device complexity.
Solution Approach 2:
The patent merges multiple detection functions (position detection, particle type identification, quality assessment) into a unified optical system. By combining multiple polarizers, cameras, and processing units into one integrated apparatus, the system achieves high classification accuracy while reducing the complexity that would result from using multiple separate devices.
3Ease of operation
If traditional optical systems are used for particle detection, then the inspection process is simple, but the ability to distinguish between benign and malignant particles is insufficient
Solution Approach 1:
The patent introduces polarized light as an intermediary medium between the illumination source and the particle detection process. By using polarizers with specific orientations as mediators, the system enhances the interaction between light and different particle types, enabling reliable distinction between benign and malignant particles while maintaining operational simplicity through automated image processing.
Solution Approach 2:
The patent changes the optical parameters of the detection system by introducing multiple polarizer orientations (0°-20°, 70°-90°, etc.). This parameter change enables the system to differentiate between particle types based on their differential light interaction properties, significantly improving quality assessment reliability while the automated processing maintains operational simplicity.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables clear differentiation between defects that impact glass quality, like metal or ceramic components, and those that do not, such as bubble components, by comparing images obtained through polarizers with different polarization directions, thereby accurately assessing the quality of flat glass.
Implementation Method 1
a first polarizer which is installed between the illumination unit and the flat glass, and has a first polarization direction; a second polarizer which is equipped in a space between the first camera and the flat glass, and has a polarization direction in the range of 0° to 20° that is different from the polarization direction of the first polarizer
Data Source
AI summary
The present invention relates to an apparatus for detecting particles in flat glass and a detecting method using the same. The present invention provides an apparatus for detecting particles in flat glass, comprising: an illumination unit which is installed in one region selected from upper and lower regions on the basis of flat glass; a first polarizer which is installed between the illumination unit and the flat glass, and has a first polarization direction; a first camera and a second camera which are installed in the opposite direction where the illumination unit is installed on the basis of the flat glass; a second polarizer which is equipped in a space between the first camera and the flat glass, and has a polarization direction in the range of 0° to 20° that is different from the polarization direction of the first polarizer; a fourth polarizer which is equipped in a space between the second camera and the flat glass, and has a polarization direction in the range of 70° to 90° that is different from the polarization direction of the first polarizer; and a processor which receives images obtained from the first camera and the second camera, and decides whether defects are benign particles or malignant particles.