Flip-Flop Using Mixed Threshold Voltage MOS Devices

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Solution Overview

Problem

Conventional flip-flop designs face a trade-off between power efficiency and performance, with standard threshold voltage MOS devices offering better speed but higher leakage current, and high threshold voltage MOS devices reducing leakage but decreasing speed, necessitating an optimization that balances both factors.

Innovation Solution

An optimized flip-flop circuit is designed by strategically combining standard threshold voltage (SVT) and high threshold voltage (HVT) MOS devices, where SVT devices are used in critical paths for maximum speed and HVT devices are used in non-critical paths to minimize leakage without compromising performance.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Speed

If standard threshold voltage MOS devices are used, then speed performance is improved, but leakage current increases

Engineering Contradiction:
Improvespeed performanceVSAvoidleakage current
Core Design Contradiction:
SpeedVSLoss of energy

Solution Approach 1:

The patent applies local quality by assigning different threshold voltage characteristics to different transistors within the flip-flop circuit. Specifically, the first and second transistors (forming the cross-coupled inverter pair) use standard threshold voltage for high speed, while the third and fourth transistors (controlling the set and reset paths) use high threshold voltage to minimize leakage. This localized differentiation resolves the contradiction by optimizing each transistor's threshold voltage according to its specific functional requirements within the circuit.

Inventive Principle:
Principle #3Local quality

2Loss of energy

If high threshold voltage MOS devices are used, then leakage current is reduced, but speed performance decreases

Engineering Contradiction:
Improveleakage currentVSAvoidspeed performance
Core Design Contradiction:
Loss of energyVSSpeed

Solution Approach 1:

The patent applies local quality by assigning different threshold voltage characteristics to different transistors within the flip-flop circuit. Specifically, the first and second transistors (forming the cross-coupled inverter pair) use standard threshold voltage for high speed, while the third and fourth transistors (controlling the set and reset paths) use high threshold voltage to minimize leakage. This localized differentiation resolves the contradiction by optimizing each transistor's threshold voltage according to its specific functional requirements within the circuit.

Inventive Principle:
Principle #3Local quality

3Productivity

If standard threshold voltage MOS devices are used, then performance is improved, but power efficiency worsens

Engineering Contradiction:
ImproveperformanceVSAvoidpower efficiency
Core Design Contradiction:
ProductivityVSUse of energy by moving object

Solution Approach 1:

The patent applies local quality by assigning different threshold voltage characteristics to different transistors within the flip-flop circuit. Specifically, the first and second transistors (forming the cross-coupled inverter pair) use standard threshold voltage for high speed, while the third and fourth transistors (controlling the set and reset paths) use high threshold voltage to minimize leakage. This localized differentiation resolves the contradiction by optimizing each transistor's threshold voltage according to its specific functional requirements within the circuit.

Inventive Principle:
Principle #3Local quality

Data Source

PatentUS8856712B2Optimized flip-flop device with standard and high threshold voltage MOS devices
Publication Date: 2014.10.07 SANDISK TECHNOLOGIES LLC
  • US8856712B2 patent drawing
  • US8856712B2 patent drawing
  • US8856712B2 patent drawing

AI summary

A flip-flop operating with standard threshold voltage MOS devices as compared with high threshold voltage MOS devices may have improved speed performance, but greater leakage current. Likewise, a flip-flop operating with high threshold voltage MOS devices may reduce the leakage current and have better power efficiency, but decreased speed and performance. An optimized flip-flop may include a combination of standard threshold voltage MOS devices and high threshold voltage MOS devices. The optimized flip-flop may have less leakage during stand-by mode as compared to a flip-flop with standard threshold voltage MOS devices. In addition, the optimized flip-flop may have better performance and speed as compared to a flip-flop with high threshold voltage MOS devices.