Floating Gate IC Layout for Routing and Area Optimization
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Solution Overview
Problem
The miniaturization of integrated circuits poses challenges in design and manufacturing, particularly in managing dummy gate isolation patterns and routing resources, leading to reliability issues and reduced performance.
Innovation Solution
The method involves replacing dummy gate isolation patterns that meet certain criteria with floating gate patterns and removing via patterns to optimize layout designs, enhancing routing resources and reducing area usage.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If dummy gate isolation patterns are used to separate cell boundaries, then manufacturing reliability is improved, but routing resources are reduced and device area increases
Solution Approach 1:
The patent extracts and removes via patterns from the layout design. These via patterns are identified as redundant elements that do not contribute to the functional performance of the integrated circuit. By removing them, the patent reduces the overall device area and improves routing resources while maintaining manufacturing reliability through the preservation of dummy gate isolation patterns that serve as cell boundary markers.
Solution Approach 2:
The patent applies different treatments to different elements in the layout: dummy gate isolation patterns are preserved to maintain cell boundary definition and manufacturing reliability, while via patterns are removed to optimize routing resources. This selective approach allows the design to maintain necessary manufacturing features while eliminating redundant elements that consume area and routing resources.
2Ease of manufacture
If via patterns are retained in the layout, then manufacturing completeness is maintained, but device area and routing congestion increase
Solution Approach 1:
The patent extracts and removes via patterns from the layout design. These via patterns are identified as redundant elements that do not contribute to the functional performance of the integrated circuit. By removing them, the patent reduces the overall device area and improves routing resources while maintaining manufacturing reliability through the preservation of dummy gate isolation patterns that serve as cell boundary markers.
3Area of stationary object
If standard cell layout is densely packed to reduce area, then device miniaturization is achieved, but design rule compliance and reliability challenges increase
Solution Approach 1:
The patent applies different treatments to different elements in the layout: dummy gate isolation patterns are preserved to maintain cell boundary definition and manufacturing reliability, while via patterns are removed to optimize routing resources. This selective approach allows the design to maintain necessary manufacturing features while eliminating redundant elements that consume area and routing resources.
Data Source
AI summary
An integrated circuit includes a first transistor of a first type, a floating gate transistor, a second transistor of a second type, and a first and second conductor. The floating gate transistor includes a drain and a source coupled to a first voltage supply, and a floating gate located on a first level, and being electrically floating. The second transistor includes a first gate separated from the floating gate in a first direction. The first conductor is on a second level, overlaps the floating gate, and is not electrically coupled to the floating gate. The second conductor is on the second level, overlaps the first gate, is separated from the first conductor in the second direction, and is electrically coupled to the second transistor.