Folded Multi-Level Ramp Generator for Noise-Resilient Amplifiers
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Solution Overview
Problem
Amplifier systems using two ramp signals are susceptible to common mode noise and information loss in the negative part of the input signal, leading to increased susceptibility to noise and disturbances.
Innovation Solution
A multi-level ramp generator providing three ramps, including a high ramp, a middle ramp, and a low ramp, where the high and low ramps are folded relative to the middle ramp, with each having approximately double the frequency of the middle ramp and different common mode levels, capturing information outside the voltage range of two ramp signals and reducing common mode error and total harmonic distortion.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If two ramp signals are used in the amplifier system, then the device complexity is reduced, but the measurement precision and reliability deteriorate due to common mode noise and information loss
Solution Approach 1:
The single ramp signal is segmented into three distinct ramp signals (first ramp, second ramp, third ramp) with different common mode voltage levels. This segmentation allows the system to capture signal information across multiple voltage ranges, preventing information loss and reducing common mode noise susceptibility while maintaining manageable device complexity through systematic waveform generation
2Device complexity
If two ramp signals are used in the amplifier system, then the device complexity is reduced, but the reliability deteriorates due to susceptibility to noise and disturbances
Solution Approach 1:
The ramp generation is segmented into three separate waveforms with different common mode voltage levels, allowing the system to distribute signal representation across multiple voltage domains. This segmentation reduces susceptibility to noise and disturbances by providing redundant signal paths that can tolerate common mode interference
Solution Approach 2:
The system transitions from a two-dimensional voltage range (covered by two ramps) to a three-dimensional voltage space by introducing ramps with different common mode levels. This dimensional expansion allows the system to capture signal information that would otherwise be lost, improving reliability without proportionally increasing complexity
3Measurement precision
If three ramps with different common mode levels are used, then the measurement precision and reliability are improved, but the device complexity increases
Solution Approach 1:
The three ramp generators are merged into a coordinated system where the first, second, and third ramps work together with frequency relationships (third ramp frequency is approximately double the first ramp frequency). This merging allows the complex functionality to be achieved through systematic integration rather than independent components, managing device complexity while improving measurement precision
Data Source
AI summary
In one example, an apparatus comprises a power stage having a first power stage input, a second power stage input, and a power stage output. The apparatus also comprises a modulator circuit having a first ramp input, a second ramp input, a modulator input, a first modulator output, and a second modulator output, the first modulator output coupled to the first power stage input, and the second modulator output coupled to the second power stage input. The apparatus also comprises a multi-level ramp generator having a first ramp output and a second ramp output, the first ramp output coupled to the first ramp input, and the second ramp output coupled the second ramp input.