Non-Volatile Configuration Bit for FPGA Routing Arrays

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Conventional memory technologies face limitations in terms of die size, memory density, switching speed, reliability, and manufacturing cost, with resistive memory technology showing promise but requiring further development for practical applications.

Innovation Solution

A configuration bit for a switching block routing array incorporating a non-volatile memory cell with a volatile resistance switching device, allowing for high scalability, fast switching speeds, and reliable operation, which can be used in field programmable gate arrays and other integrated circuits.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If conventional memory technologies are used, then manufacturing cost and die size are constrained, but memory density and switching speed are limited

Engineering Contradiction:
Improvedata reliabilityVSAvoidmemory cell structure
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent merges the memory storage function and the configuration control function into a single integrated cell structure. The non-volatile memory element (such as RRAM, PCM, or MRAM) is combined with a volatile switching element (such as a transistor or diode) to form an unified configuration bit cell that provides both reliable data retention and active control capabilities, eliminating the need for separate memory and logic structures

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The configuration bit cell is designed to perform multiple functions: it provides non-volatile data storage for configuration information, enables volatile switching for active control of routing paths, and integrates both functions in a single reconfigurable unit. This multi-functional design allows the same cell structure to serve as both memory and switch, reducing overall device complexity

Inventive Principle:
Principle #6Universality (Multi-functionality)

2Speed

If resistive memory technology is used, then switching speed improves, but manufacturing development and practical application face challenges

Engineering Contradiction:
Improveswitching speedVSAvoidmanufacturing process
Core Design Contradiction:
SpeedVSEase of manufacture

Solution Approach 1:

The patent employs composite material structures in the non-volatile memory element, such as metal-oxide layers (e.g., HfOx, TaOx) combined with other functional materials to achieve both fast switching characteristics and compatibility with standard semiconductor manufacturing processes. The multi-layer composite structure enables controllable resistive switching while using materials that can be deposited using existing PECVD or ALD techniques

Inventive Principle:
Principle #40Composite materials

Solution Approach 2:

The invention utilizes parameter changes in the non-volatile memory element to achieve fast switching. By changing the resistance state of the non-volatile element between high and low states through controlled electrical pulses, the configuration bit can be rapidly set or reset. The switching speed is controlled by adjusting pulse width, amplitude, and timing parameters, allowing optimization for different application requirements while maintaining manufacturing feasibility

Inventive Principle:
Principle #35Parameter changes

3Area of stationary object

If configuration bit density is increased, then silicon footprint is reduced, but manufacturing precision requirements increase

Engineering Contradiction:
Improvesilicon footprintVSAvoidfabrication precision
Core Design Contradiction:
Area of stationary objectVSManufacturing precision

Solution Approach 1:

The configuration bit cell is segmented into distinct functional regions: a non-volatile memory element region and a volatile switching element region, with clearly defined interconnections. This segmentation allows each component to be optimized independently for its specific function while maintaining compact overall dimensions. The segmented design also simplifies the fabrication process by allowing separate formation of memory and switch components using standard process steps

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent employs vertical stacking or three-dimensional integration approaches to increase configuration bit density without proportionally increasing planar footprint. By utilizing the vertical dimension for layer stacking (e.g., multiple metal layers, insulator layers, and functional layers stacked vertically), the design achieves higher density while maintaining compatibility with planar fabrication processes, thereby reducing the impact on manufacturing precision requirements

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

4Duration of action of stationary object

If non-volatile memory cells are integrated into switching blocks, then configuration retention improves, but device complexity increases

Engineering Contradiction:
Improveconfiguration retentionVSAvoidcell structure
Core Design Contradiction:
Duration of action of stationary objectVSDevice complexity

Solution Approach 1:

The patent merges the memory storage function and the configuration control function into a single integrated cell structure. The non-volatile memory element (such as RRAM, PCM, or MRAM) is combined with a volatile switching element (such as a transistor or diode) to form an unified configuration bit cell that provides both reliable data retention and active control capabilities, eliminating the need for separate memory and logic structures

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The non-volatile memory element inherently provides configuration retention without requiring external power or refresh operations. The cell structure utilizes the natural properties of the non-volatile element to maintain configuration state indefinitely, eliminating the need for additional retention circuitry or control mechanisms that would increase device complexity

Inventive Principle:
Principle #25Self-service

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The proposed solution enables significant improvements in switching block technologies and field programmable gate arrays by providing high configuration bit density, fast switching, and long-term reliability, reducing the need for external memory and minimizing silicon footprint.

Implementation Method 1

A non-volatile memory cell can comprise a volatile resistance switching device connected in serial to a gate node of the switch, configured to trap charge at the gate node to activate the switch, or release the charge at the gate node to deactivate the switch

Methodology Applied
Scientific EffectCharge trapping: Capacitance

Data Source

PatentUS10541025B2Switching block configuration bit comprising a non-volatile memory cell
Publication Date: 2020.01.21 CROSSBAR INC
  • US10541025B2 patent drawing
  • US10541025B2 patent drawing
  • US10541025B2 patent drawing

AI summary

A configuration bit for a switching block routing array comprising a non-volatile memory cell is provided. By way of example, the configuration bit and switching block routing array can be utilized for a field programmable gate array, or other suitable circuit(s), integrated circuit(s), application specific integrated circuit(s), electronic device or the like. The configuration bit can comprise a switch that selectively connects or disconnects a node of the switching block routing array. A non-volatile memory cell connected to the switch can be utilized to activate or deactivate the switch. In one or more embodiments, the non-volatile memory cell can comprise a volatile resistance switching device connected in serial to a gate node of the switch, configured to trap charge at the gate node to activate the switch, or release the charge at the gate node to deactivate the switch.