Fuse IP BIST Check Bits for Parallel Blown Error Detection
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Solution Overview
Problem
Current methods for detecting fuse errors in semiconductor devices are time-consuming and inefficient, particularly with large numbers of fuse bits, and require reading a fuse file to determine the original configuration status, which is difficult to achieve accurately.
Innovation Solution
A built-in self-test (BIST) device and method that incorporates check bits with fuse elements to perform logical operations, such as parity checks or cyclic redundancy checks, to simultaneously detect blown errors in multiple fuses, reducing inspection time and eliminating the need for a fuse file.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If a dumping test is adopted to detect fuses one bit at a time, then the detection method is simple, but the inspection time becomes very time consuming when the number of fuse bits is large
Solution Approach 1:
The patent merges multiple fuse bit detections into a single parallel operation by using a BIST device that can simultaneously check multiple fuse elements. The computing circuit processes multiple fuse bits in parallel rather than sequentially, combining what would traditionally be multiple separate detection operations into one unified test that completes in a single clock cycle.
Solution Approach 2:
The patent transitions from a temporal dimension of detection (sequential one-bit-at-a-time testing) to a spatial dimension (parallel multi-bit simultaneous testing). By using multiple check bits and a computing circuit that processes all fuse bits in parallel, the system detects fuse status across multiple dimensions simultaneously, dramatically reducing inspection time.
2Device complexity
If a dumping test is adopted, then the detection process is straightforward, but it requires reading a fuse file to determine original configuration status, making error detection difficult
Solution Approach 1:
The BIST device performs self-testing by using check bits that are automatically generated and stored with the fuse configuration. The system serves itself by internally verifying fuse status without requiring external reference files or manual comparison processes. The computing circuit automatically compares current fuse states against the stored check bits to detect errors.
Solution Approach 2:
The patent applies preliminary action by pre-calculating and storing check bits alongside the fuse configuration during manufacturing. These check bits serve as pre-computed reference values that enable automatic error detection later, eliminating the need to read and parse fuse files during testing.
3Productivity
If multiple fuse bits are tested simultaneously, then inspection time is reduced, but the device complexity increases with additional check bits and computing circuits
Solution Approach 1:
The BIST device achieves multi-functionality by using a single computing circuit to handle multiple fuse bit comparisons simultaneously. The same check bits and computing resources serve multiple purposes: verifying different fuse configurations, detecting various error conditions, and providing comprehensive coverage without requiring separate dedicated circuits for each fuse bit.
Data Source
AI summary
A built-in self-test (BIST) device and an error detection method are provided. The BIST device is for fuse intellectual properties (IPs). The BIST device includes at least one fuse element, a computing circuit, a power supply circuit, and a processor. Each fuse element corresponds to the fuse IPs and provides a corresponding fuse bit value, and each fuse element further includes a check bit for providing a check bit value. The processor controls the computing circuit to obtain the fuse bit values and the check bit value from the at least one fuse element, and performs a logical operation based on the fuse bit values and the check bit value to generate a check result. The check result is used to indicate whether a blown error occurs in the at least one fuse element.