Backside Self-Aligned Power Rail Structure for GAA Short Isolation

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Solution Overview

Problem

Conventional power rail schemes in gate-all-around (GAA) devices face challenges such as low density, high resistance, and short circuit issues due to process limitations, leading to degraded semiconductor performance.

Innovation Solution

A self-aligned backside power rail scheme is implemented, utilizing a bottom dielectric layer to control via position and prevent short circuits between the metal gate and power rail, or between source and drain regions, by ensuring the via only connects to the source region.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Quantity of substance

If existing power rail schemes are used in GAA devices, then power lines can be formed on the backside of the substrate, but the density is low and resistance is high due to process limitations

Engineering Contradiction:
Improvepower rail densityVSAvoidpower rail resistance
Core Design Contradiction:
Quantity of substanceVSReliability

Solution Approach 1:

The patent forms power rails on the backside of the substrate in a different spatial dimension, utilizing the vertical thickness of the substrate to create self-aligned power rails that extend through the substrate. This dimensional approach allows for higher density power rails with better electrical characteristics by leveraging the third dimension (depth/thickness) rather than only planar arrangements.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The patent performs preliminary actions by forming the power rails and their associated vias simultaneously through a self-aligned process. The via holes are formed first, then the power rail material is deposited to fill these pre-formed holes, ensuring precise alignment and optimal electrical connection before subsequent device fabrication steps.

Inventive Principle:
Principle #10Preliminary action

2Quantity of substance

If existing power rail schemes are used, then power lines can be formed on the backside, but isolation between the metal gate and the power line is very challenged

Engineering Contradiction:
Improvepower rail formationVSAvoidshort circuit between metal gate and power line
Core Design Contradiction:
Quantity of substanceVSObject-affected harmful factors

Solution Approach 1:

The patent introduces an intermediary dielectric layer that fills the space between the power rails and the metal gates. This dielectric material acts as an electrical insulator, preventing short circuits while allowing the power rails to be formed on the backside. The intermediary layer is carefully engineered to provide adequate isolation without interfering with the electrical performance of the power delivery network.

Inventive Principle:
Principle #24Intermediary (Mediator)

3Quantity of substance

If existing power rail schemes are used, then power lines can be formed on the backside, but short issue from the source region to the drain region may occur

Engineering Contradiction:
Improvepower rail configurationVSAvoidshort circuit between source and drain
Core Design Contradiction:
Quantity of substanceVSObject-affected harmful factors

Solution Approach 1:

The patent employs a self-aligned formation process where the via holes for power rail connection are automatically positioned to align with the source region, eliminating the need for separate alignment steps. This self-service approach ensures that power rails connect only to the intended source region without creating unintended short circuits to the drain region, as the alignment is inherent to the process geometry rather than relying on precise overlay control.

Inventive Principle:
Principle #25Self-service

Data Source

PatentUS20240250141A1Semiconductor device with backside self-aligned power rail and methods of forming the same
Publication Date: 2024.07.25 TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD
  • US20240250141A1 patent drawing
  • US20240250141A1 patent drawing
  • US20240250141A1 patent drawing

AI summary

Semiconductor device and the manufacturing method thereof are disclosed. An exemplary semiconductor device comprises a dielectric layer formed over a conductive feature; a semiconductor stack formed over the dielectric layer, wherein the semiconductor stack including semiconductor layers stacked up and separated from each other; a first metal gate structure and a second metal gate structure formed over a channel region of the semiconductor stack, wherein the first metal gate structure and the second metal gate structure wrap each of the semiconductor layers of the semiconductor stack; and a first epitaxial feature disposed between the first metal gate structure and the second metal gate structure over a first source/drain region of the semiconductor stack, wherein the first epitaxial feature extends through the dielectric layer and contacts the conductive feature.