Global Bit Line Boosting for Faster Memory Signal Latching

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Solution Overview

Problem

Memory devices with multiple memory banks experience significant time delays in signal transmission due to increased distance between local and global input/output circuits, necessitating prolonged charging times for signals to be latched, which delays data access.

Innovation Solution

Implementing a booster circuit and latch circuit within the global input/output circuit to drive and latch signals independently of local circuit charging, reducing dependency on local circuit charging times.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Quantity of substance

If the distance between LIO circuit and GIO circuit is increased to accommodate multiple memory banks, then the memory device can store more data, but the signal transmission time delay increases

Engineering Contradiction:
Improvedata storage capacityVSAvoidsignal transmission time delay
Core Design Contradiction:
Quantity of substanceVSLoss of time

Solution Approach 1:

The patent segments the signal transmission path by introducing intermediate boosting circuits at strategic points between LIO and GIO circuits. This divides the long transmission path into shorter segments, each with its own boosting circuit that refreshes the signal, thereby reducing cumulative transmission delay while maintaining the physical separation needed for multiple memory banks

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent introduces boosting circuits as intermediary elements between LIO and GIO circuits. These intermediary circuits actively refresh and reinforce signals during transmission, compensating for the increased distance and reducing time delay without requiring the LIO and GIO circuits to be physically closer

Inventive Principle:
Principle #24Intermediary (Mediator)

2Reliability

If the charging time of signals in LIO circuit is prolonged to ensure signals are latched in GIO circuit, then signal latching reliability is improved, but data access time increases

Engineering Contradiction:
Improvesignal latching reliabilityVSAvoiddata access time
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The patent applies preliminary action by pre-charging and pre-boosting signals in the LIO circuit and intermediate boosting circuits before the signals reach the GIO circuit. This preliminary reinforcement ensures that signals arrive at the GIO circuit with sufficient strength for reliable latching, eliminating the need for prolonged charging times

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent replaces the passive mechanical charging process with active electronic boosting circuits. Instead of relying solely on capacitive charging over time, voltage-boosting circuits actively amplify and refresh signals, providing reliable latching without requiring extended charging durations

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

3Device complexity

If the dependency of latching signals in GIO circuit on charging signals in LIO circuit is maintained, then circuit design is simplified, but access time is increased

Engineering Contradiction:
Improvecircuit design complexityVSAvoidaccess time
Core Design Contradiction:
Device complexityVSLoss of time

Solution Approach 1:

The patent segments the signal processing function by separating charging (performed in LIO circuit) from boosting (performed in intermediate circuits and GIO circuit). This segmentation allows each circuit to perform its specialized function efficiently, reducing access time while maintaining manageable complexity through modular design

Inventive Principle:
Principle #1Segmentation

Data Source

PatentUS20250356889A1Global Boosting Circuit
Publication Date: 2025.11.20 TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD
  • US20250356889A1 patent drawing
  • US20250356889A1 patent drawing
  • US20250356889A1 patent drawing

AI summary

Systems and methods are provided for a memory device including a first memory array, a local input/output (LIO) circuit, and a global input/output (GIO) circuit. The first memory array includes a memory cell and a local bit line. The LIO circuit is configured to receive a local bit line signal on the local bit line and to generate a global bit line signal on a global bit line based on the local bit line signal. The GIO circuit is coupled to the LIO circuit and is configured to receive the global bit line signal. The GIO circuit comprises a latch circuit including a global bit line signal latch that is configured to latch the global bit line signal, and a booster circuit that is configured to drive the global bit line signal in the GIO circuit based on a previous global bit line signal.