Multifunctional Handler System for Semiconductor Testing
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Solution Overview
Problem
Existing semiconductor device handlers face inefficiencies due to their 'last in, first out' loading sequence, integrated test chamber with loading and sorting units, and difficulty in maintaining constant temperature during testing, leading to operational challenges and limited productivity.
Innovation Solution
A multifunctional handler system with separate loading, sorting, and testing sections, connected to a host computer, allowing independent operation, 'first in, first out' tray sequencing, and a thermally controlled test chamber with multiple spaces and pipelines for temperature management.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If the test chamber part is integrated with the loading and sorting and unloading units, then the structure is compact, but the operation of the whole handler system stops when either part is out of order and repairs are difficult
Solution Approach 1:
The patent divides the handler system into separate functional modules: a test chamber module and a loading/sorting/unloading module. This segmentation allows independent operation and maintenance of each module, so that failures in one module do not necessarily stop the entire system, thereby improving reliability while maintaining structural organization.
2Productivity
If the test chamber part has a faster processing speed than the loading and sorting and unloading units, then the test efficiency can be enhanced, but the operation is limited by the slower loading and sorting units
Solution Approach 1:
The patent implements preliminary actions by having the loading unit prepare and load trays into the test chamber in advance, and the sorting unit prepare sorting positions before testing completes. This allows the test chamber to operate at its full speed without waiting for loading or sorting operations, eliminating waiting time and maximizing test efficiency.
3Quantity of substance
If a number of semiconductor devices are tested in the test chamber, then the test capacity increases, but a constant temperature cannot be maintained due to heat generated by the devices
Solution Approach 1:
The patent introduces an intermediary thermal management system between the semiconductor devices and the test chamber environment. This includes heat dissipation structures and temperature control mechanisms that actively manage the heat generated by multiple devices during testing, maintaining constant temperature conditions even at high test capacities.
Data Source
AI summary
A multifunctional handler system for electrical testing of semiconductor devices is provided. The multifunctional handler system comprises: (1) a semiconductor device processing section comprising a loading unit including a buffer, a sorting unit including a separate marking machine, and a unloading unit; (2) a semiconductor device testing section, separate from the semiconductor device processing section, comprises a test chamber, the test chamber is separated into two or more test spaces, and the test spaces of the test chamber include a second chamber positioned at a lower position, a first chamber positioned above the second chamber, and pipelines for connecting the first and second chambers to each other; and (3) a host computer which is independently connected to the semiconductor device processing section and the semiconductor device testing section and controls tray information, test results, marking information, and test program information.