Monolithic HEMT-Schottky Layout for Uninterrupted Reverse Current

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Solution Overview

Problem

Field-effect semiconductor devices, such as HEMT and MESFET, face challenges when connected to inductive or capacitive loads, leading to reverse voltage issues and require complex and costly circuitry for normal-off operation, and integrating a discrete diode increases size and cost.

Innovation Solution

A monolithic integrated circuit combining a field-effect semiconductor device with a Schottky diode, where the Schottky electrode is positioned away from the source across the gate, ensuring current flow without depletion region interruption, and a carrier storage layer is used to achieve normally-off operation.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If a discrete diode is connected in parallel with the field-effect semiconductor device for feedback and protection, then the device reliability is improved, but the device size and manufacturing cost increase

Engineering Contradiction:
Improvedevice reliabilityVSAvoiddevice size
Core Design Contradiction:
ReliabilityVSArea of stationary object

Solution Approach 1:

The patent merges the diode function with the field-effect semiconductor device by forming a Schottky diode within the same semiconductor structure. The Schottky electrode is formed on the semiconductor layer to create a Schottky diode, while the gate electrode controls the field-effect device. This integration eliminates the need for a separate discrete diode, reducing device size while maintaining feedback and protection functions.

Inventive Principle:
Principle #5Merging (Combining)

2Reliability

If a discrete diode is connected in parallel with the field-effect semiconductor device for feedback and protection, then the device reliability is improved, but the manufacturing cost increases

Engineering Contradiction:
Improvedevice reliabilityVSAvoidmanufacturing cost
Core Design Contradiction:
ReliabilityVSEase of manufacture

Solution Approach 1:

The patent combines the diode and field-effect device fabrication into a single monolithic process. Both the Schottky diode (via Schottky electrode) and the field-effect device (via gate electrode) are formed on the same semiconductor layer using integrated manufacturing steps, eliminating the need for separate discrete component assembly and reducing manufacturing cost.

Inventive Principle:
Principle #5Merging (Combining)

3Ease of manufacture

If the Schottky electrode is positioned on the source side of the gate, then the diode can be integrated, but the current flow is interrupted by the depletion region when the device is off

Engineering Contradiction:
Improveintegration capabilityVSAvoidcurrent flow continuity
Core Design Contradiction:
Ease of manufactureVSReliability

Solution Approach 1:

The patent positions the Schottky electrode on the drain side of the gate electrode, changing the spatial arrangement from source-side to drain-side. This dimensional repositioning ensures that the Schottky diode current path does not intersect with the gate's depletion region, allowing continuous current flow when the device is off while maintaining integration.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

4Ease of operation

If a negative power supply is used to turn off the HEMT, then the device can operate normally off, but the circuitry becomes complex and expensive

Engineering Contradiction:
Improvenormally-off operationVSAvoidcircuitry complexity
Core Design Contradiction:
Ease of operationVSDevice complexity

Solution Approach 1:

The patent modifies the semiconductor layer to create an asymmetric structure with different doping concentrations in the source and drain regions. This parameter change creates an inherent potential barrier that prevents current flow in the off state without requiring negative gate voltage, enabling normally-off operation through structural parameters rather than complex circuitry.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The solution allows for compact, cost-effective integration of a diode within the semiconductor device, ensuring reliable feedback and protection without size increase and enabling normally-off operation without negative power supply complexity.

Implementation Method 1

a Schottky electrode which is formed on the main semiconductor region in Schottky contact therewith in order to provide a Schottky diode

Methodology Applied
Scientific EffectSchottky contact: Diode

Implementation Method 2

The two-dimensional electron gas layer of the field-effect semiconductor device will then be interrupted by the depletion region spreading from the gate when the device is off

Methodology Applied
Scientific EffectDepletion region: Electric Field

Implementation Method 3

The piezoelectric and spontaneous depolarization of the heterojunction surfaces creates the familiar two-dimensional electron gas layer as the channel between drain and source

Methodology Applied
Scientific EffectPiezoelectric depolarization: Piezoelectric Effect

Implementation Method 4

The piezoelectric and spontaneous depolarization of the heterojunction surfaces creates the familiar two-dimensional electron gas layer as the channel between drain and source

Methodology Applied
Scientific EffectSpontaneous depolarization: Polarisation

Data Source

PatentUS20110260777A1Monolithic integrated circuit
Publication Date: 2011.10.27 SANKEN ELECTRIC CO LTD
  • US20110260777A1 patent drawing
  • US20110260777A1 patent drawing
  • US20110260777A1 patent drawing

AI summary

A field-effect semiconductor device such as a HEMT or MESFET is monolithically integrated with a Schottky diode for feedback, regeneration, or protection purposes. The field-effect semiconductor device includes a main semiconductor region having formed thereon a source, a drain, and a gate between the source and the drain. Also formed on the main semiconductor region, preferably between gate and drain, is a Schottky electrode electrically coupled to the source. The Schottky electrode provides a Schottky diode in combination with the main semiconductor region. A current flow is assured from Schottky electrode to drain without interruption by a depletion region expanding from the gate.