Heterogeneous Superjunction Structure for Higher Breakdown Voltage

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

One-dimensional unipolar power devices face limitations due to increasing specific on-resistance with the square of breakdown voltage, and vertical superjunction devices suffer from peak electric fields that limit breakdown voltage.

Innovation Solution

The design incorporates a substrate with a first semiconductor region and a second semiconductor region of different conductivity types, forming a superjunction structure with the second semiconductor region having a higher product of critical electric field and permittivity, which reduces peak electric fields by maintaining a charge balance between the two regions, thereby improving breakdown voltage.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Strength

If one-dimensional unipolar power devices are used to achieve high breakdown voltage, then the breakdown voltage is improved, but the specific on-resistance increases with the square of the breakdown voltage

Engineering Contradiction:
Improvebreakdown voltageVSAvoidspecific on-resistance
Core Design Contradiction:
StrengthVSReliability

Solution Approach 1:

The drift region is segmented into alternating n-type and p-type semiconductor regions forming a superjunction structure. This segmentation allows charge balance between the regions to reduce peak electric fields while maintaining low on-resistance, resolving the contradiction between high breakdown voltage and low specific on-resistance

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent changes the material parameters of the semiconductor regions by selecting materials with different products of critical electric field and permittivity. This parameter change enables optimization of the charge balance in the superjunction structure, allowing simultaneous achievement of high breakdown voltage and low specific on-resistance

Inventive Principle:
Principle #35Parameter changes

2Reliability

If vertical superjunction devices are used to reduce specific on-resistance, then the specific on-resistance is improved, but peak electric fields limit the breakdown voltage

Engineering Contradiction:
Improvespecific on-resistanceVSAvoidbreakdown voltage
Core Design Contradiction:
ReliabilityVSStrength

Solution Approach 1:

The patent changes the material parameters by selecting semiconductor materials with different products of critical electric field and permittivity for the alternating n-type and p-type regions. This enables optimization of the charge balance to reduce peak electric fields while maintaining low on-resistance

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The superjunction structure uses composite semiconductor materials with different conductivity types and material properties. The alternating n-type and p-type regions with different critical electric field and permittivity products create a composite structure that balances charge distribution and reduces peak electric fields

Inventive Principle:
Principle #40Composite materials

Data Source

PatentUS20240186370A1Heterogeneous superjunction devices
Publication Date: 2024.06.06 VIRGINIA TECH INTELLECTUAL PROPERTIES INC
  • US20240186370A1 patent drawing
  • US20240186370A1 patent drawing
  • US20240186370A1 patent drawing

AI summary

A device may include a substrate of a first conductivity type, the first conductivity type being one of a n-type conductivity and a p-type conductivity, the substrate having a base surface. A device may include a first terminal coupled with the base surface of the substrate, a first semiconductor region disposed over the substrate, the substrate positioned between the first semiconductor region and the first terminal, the first semiconductor region including a top surface, which defines a plurality of trenches having sidewalls, the plurality of trenches separated by a plurality of pillars, the first semiconductor region formed of a first material with the first conductivity type, a second semiconductor region disposed over the sidewalls of the first semiconductor region to form a superjunction with the first semiconductor region, the second semiconductor region formed of a second material different from the first material and having a second conductivity type.