Hierarchical Bit Line Structure for DRAM Integration Density

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Solution Overview

Problem

Existing semiconductor memory devices face performance issues due to increased parasitic capacitance and resistance in large DRAMs, particularly when using hierarchical bit line structures, which hinder the integration and efficiency of memory cell arrays and require larger areas for sense amplifiers.

Innovation Solution

A semiconductor memory device with a hierarchical memory cell array configuration that uses single-ended sense amplifiers connected directly to local bit lines, reducing parasitic capacitance and resistance by shortening bit line lengths and employing a hierarchical structure with local and global bit lines, allowing for higher integration and faster access speeds.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Quantity of substance

If a hierarchical memory cell array with local bit lines is configured, then integration density is improved, but parasitic capacitance and resistance of bit lines increase

Engineering Contradiction:
Improveintegration densityVSAvoidparasitic capacitance and resistance
Core Design Contradiction:
Quantity of substanceVSObject-affected harmful factors

Solution Approach 1:

The bit line is divided into local bit lines and global bit lines. Local bit lines are shortened to reduce parasitic capacitance and resistance, while global bit lines handle the long-distance transmission. This segmentation allows high integration density without excessive parasitic effects.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Local sense amplifiers are introduced as intermediaries between memory cells and global sense amplifiers. These local sense amplifiers are connected directly to local bit lines to amplify signals before they are transmitted through global bit lines, compensating for signal degradation.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Device complexity

If single-ended sense amplifiers are used instead of differential sense amplifiers, then circuit scale is reduced, but ability to amplify minute potential difference deteriorates

Engineering Contradiction:
Improvecircuit scaleVSAvoidability to amplify minute potential difference
Core Design Contradiction:
Device complexityVSMeasurement precision

Solution Approach 1:

Local sense amplifiers serve as intermediaries that amplify the minute potential difference from local bit lines before the signal is transmitted to global bit lines. This allows single-ended amplifiers to achieve sufficient gain without requiring differential configurations.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The sense amplifier function is segmented into local and global levels. Local sense amplifiers handle the sensitive amplification task close to the memory cells, while global sense amplifiers handle the final output. This segmentation enables the use of simpler single-ended amplifiers at the local level.

Inventive Principle:
Principle #1Segmentation

3Device complexity

If sense amplifiers are connected to global bit lines instead of local bit lines, then circuit configuration is simplified, but operating performance deteriorates due to long bit line length

Engineering Contradiction:
Improvecircuit configurationVSAvoidoperating performance
Core Design Contradiction:
Device complexityVSProductivity

Solution Approach 1:

The sense amplifier system is segmented into local and global components. Local sense amplifiers are connected directly to local bit lines for fast signal amplification, while global sense amplifiers are connected to global bit lines for final output. This segmentation maintains both simplicity and high operating performance.

Inventive Principle:
Principle #1Segmentation

Data Source

PatentUS7697358B2Semiconductor memory device
Publication Date: 2010.04.13 LONGITUDE LICENSING LTD
  • US7697358B2 patent drawing
  • US7697358B2 patent drawing
  • US7697358B2 patent drawing

AI summary

A semiconductor memory device comprises word lines, global bit lines intersecting with the word lines; local bit lines partitioned into N sections along the global bit lines and aligned with a same pitch as the global bit lines; N memory cell arrays each including memory cells formed at intersections of the word lines and the local bit lines and being arranged corresponding to the sections of the local bit lines; local sense amplifiers for amplifying a signal read out from a selected memory cell to the local bit line and for outputting the signal to the global bit line; global sense amplifiers for amplifying the signal transmitted from the local sense amplifier corresponding to the selected memory cell through the global bit line and for selectively coupling the signal to an external data line.