IC Design Minimizing Local Layout Effects

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Solution Overview

Problem

As semiconductor manufacturing processes are miniaturized, the local layout effect (LLE) in integrated circuits (ICs) becomes significant, affecting the performance of standard cells due to their peripheral structures, making it challenging to design ICs that minimize these effects while maintaining desired functionality.

Innovation Solution

A method and system for designing ICs that utilize a standard cell library, pre-placers, instance placers, routers, instance characterizers, and performance analyzers to place standard cells in a way that minimizes LLE by considering the physical characteristics influenced by peripheral layouts, and generating layout data that reduces LLE-causing structures and optimizes IC performance.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If standard cell instances are placed in arrays with reduced size to enable manufacturing process miniaturization, then manufacturing scalability is improved, but local layout effects increase and worsen IC performance

Engineering Contradiction:
Improvemanufacturing scalabilityVSAvoidIC performance
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

The pre-placer performs preliminary placement of standard cell instances before the main placement process. By pre-positioning instances and identifying potential LLE-causing structures in advance, the system can proactively adjust placements to avoid performance-degrading patterns while maintaining manufacturing scalability through continued miniaturization

Inventive Principle:
Principle #10Preliminary action

2Area of stationary object

If standard cell instances are densely packed to reduce IC area, then area efficiency is improved, but local layout effects intensify and degrade performance

Engineering Contradiction:
ImproveIC areaVSAvoidIC performance
Core Design Contradiction:
Area of stationary objectVSReliability

Solution Approach 1:

The system applies local quality by differentiating placement strategies based on local layout context. The pre-placer identifies specific regions where LLE is likely to occur and applies targeted placement adjustments in those local areas, rather than uniformly spacing all instances. This allows dense packing in regions where LLE is not problematic while maintaining performance in sensitive regions

Inventive Principle:
Principle #3Local quality

3Productivity

If conventional placement methods are used without considering peripheral layout, then placement speed is improved, but LLE-causing structures are generated that worsen performance

Engineering Contradiction:
Improveplacement speedVSAvoidIC performance
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

The pre-placer performs preliminary placement actions that identify and mitigate potential LLE issues before the main placement algorithm executes. This preliminary step flags problematic patterns early, allowing the subsequent placement process to avoid generating LLE-causing structures while maintaining overall placement efficiency

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The system incorporates feedback mechanisms where the pre-placer analyzes the evolving layout during placement and adjusts subsequent placement decisions based on identified LLE patterns. This feedback loop allows the placement algorithm to adapt in real-time, avoiding performance-degrading structures while maintaining placement speed through efficient heuristic guidance

Inventive Principle:
Principle #23Feedback

Data Source

PatentUS10817637B2System and method of designing integrated circuit by considering local layout effect
Publication Date: 2020.10.27 SAMSUNG ELECTRONICS CO LTD
  • US10817637B2 patent drawing
  • US10817637B2 patent drawing
  • US10817637B2 patent drawing

AI summary

A system and method of designing an integrated circuit (IC) by considering a local layout effect are provided. The method of designing an IC may place instances of pre-placement cells so as to decrease occurrence of a local layout effect (LLE) causing structure. The method may extract a context of an instance from a peripheral layout of each of the placed instances to estimate an LLE of the instance, thereby analyzing a performance of the IC.