Semiconductor IC Macro Modeling for Accurate Multi-Condition Simulation
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Solution Overview
Problem
Current circuit design simulation methods for semiconductor integrated circuit devices are inefficient, particularly for large-scale systems, as they require extensive computation time and struggle to accurately represent the characteristics of semiconductor integrated circuit devices under varying operation conditions, leading to inaccurate simulations and potential failures in test production.
Innovation Solution
A macro model that includes a characteristics setting block using array data derived from evaluation measurement data to set internal parameters of functional blocks, allowing for accurate simulation of semiconductor integrated circuit devices under various operation conditions, such as supply voltage and ambient temperature, through a lookup table that optimizes internal parameters for different conditions.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional circuit design simulation methods are used for large-scale semiconductor integrated circuit devices, then the simulation can be performed with basic circuit elements, but the computation time becomes excessively long and the accuracy deteriorates under varying operation conditions
Solution Approach 1:
The patent segments the semiconductor integrated circuit device into multiple functional blocks (e.g., power supply block, filter block, characteristics setting block) that can be simulated independently. Each functional block is represented by a macro model with specific internal parameters, allowing the overall device to be simulated by combining these segmented parts rather than simulating the entire device at once, thus reducing computation time while maintaining accuracy.
Solution Approach 2:
The patent creates macro models that are simplified copies of the actual semiconductor integrated circuit device. These macro models replicate the essential characteristics and behavior of the device under various operation conditions using a reduced set of circuit elements and parameters, enabling accurate simulation without the computational burden of modeling every detail of the actual device.
2Adaptability or versatility
If conventional simulation models are used, then the model structure remains simple, but the ability to accurately represent device characteristics under varying operation conditions deteriorates
Solution Approach 1:
The patent introduces dynamic characteristics setting blocks that can adjust internal parameters of functional blocks based on operation conditions such as supply voltage and temperature. This dynamic adaptation allows the macro model to accurately represent device characteristics across varying operation conditions without requiring a completely different model for each condition, balancing adaptability with manageable complexity.
Solution Approach 2:
The patent changes the values of internal parameters within functional blocks based on operation conditions. By adjusting parameters such as resistance, capacitance, and gain according to supply voltage and temperature variations, the macro model maintains accuracy across different operating environments without increasing structural complexity.
Data Source
AI summary
For example, a macro model of a semiconductor integrated circuit device is used in a circuit design simulator, and comprises a plurality of functional blocks and a characteristic setting block. The functional blocks are each configured to cause the circuit design simulator to show approximate representation or equivalent representation of the characteristic of the semiconductor integrated circuit device. The characteristic setting block sets at least one of a plurality of internal parameters provided in the functional blocks by using array data derived from evaluation measurement data obtained by actual measurement of the semiconductor integrated circuit device.