Integrated Circuit Segmentation for Latch-Up Protection
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Solution Overview
Problem
Integrated circuits are prone to latch-up phenomena caused by ionizing radiation, leading to short-circuits between supply voltage and ground, which can result in significant consumption and operation errors, and existing solutions either increase circuit size or do not completely eliminate the risk of short-circuits.
Innovation Solution
The integration circuit is divided into elementary blocks, each connected to the main supply network through current-limiting devices that can stop short-circuits, with error-correction means to correct logic errors, and current detectors to locate and address potential errors.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If the circuit structure is modified to avoid latch-up phenomenon, then reliability is improved, but device complexity increases
Solution Approach 1:
The integrated circuit is divided into multiple independently powered elementary blocks, each with its own power supply lines. This segmentation isolates latch-up effects to individual blocks, preventing system-wide failures while maintaining overall circuit functionality.
Solution Approach 2:
Current-limiting devices are introduced as intermediary components between the power supply network and each elementary block. These devices detect and limit abnormal currents, acting as mediators that prevent latch-up propagation without requiring fundamental changes to the core circuit architecture.
2Reliability
If current-limiting devices are added to stop short-circuits, then reliability is improved, but device complexity increases
Solution Approach 1:
The power supply network is segmented into multiple independent paths, each serving a specific elementary block. Current-limiting devices are distributed along these segmented paths, providing localized protection that scales with the circuit size rather than adding centralized complexity.
Solution Approach 2:
Each elementary block includes its own current-limiting device and error-correction means, enabling self-protection and self-correction. When a latch-up occurs in one block, it automatically limits its own current and corrects its own errors without requiring external intervention, reducing overall system complexity.
3Reliability
If elementary blocks are isolated by current-limiting devices, then reliability is improved, but use of energy increases
Solution Approach 1:
The current-limiting devices operate dynamically, switching between normal conduction mode and current-limiting mode based on detected conditions. During normal operation, they present minimal resistance to maintain low power consumption. Upon detecting a latch-up condition, they automatically transition to current-limiting mode to isolate the affected block.
Solution Approach 2:
Power consumption characteristics are optimized locally for each elementary block's current-limiting device. The devices are designed to consume minimal energy during normal operation while providing sufficient current-limiting capability only when and where needed, rather than uniformly increasing power consumption across the entire circuit.
Data Source
AI summary
An integrated circuit chip comprising a number of semiconductor components exhibiting parasitic components through which a short-circuit between the circuit supply voltage and ground could occur, wherein said semiconductor components are distributed in elementary blocks, each elementary block being independently connected, for its power supply, to the supply or ground lines of the main supply network of the integrated circuit by a current-limiting device capable of stopping a short-circuit starting in the considered block, and each block being sized so that logic errors occurring in this block are correctable by error-correction means.