IC Tag Circuit Folding Endurance via Curved Terminal Width
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Solution Overview
Problem
Non-contact IC tags are prone to circuit line breakage when folded due to stress concentration at the junction between the circuit line and the terminal portion, leading to loss of functionality in managing recorded information.
Innovation Solution
The electronic circuit incorporates a folding endurance structure at the junction, featuring a terminal portion with a plane width that gradually increases away from the junction, with at least one side edge being a curved line, enhancing the circuit's ability to withstand folding without breaking.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If the terminal portion has a large plane flat surface area to improve connection reliability, then the connection reliability between IC chip and jumper line is improved, but the circuit line breaks due to stress concentration at the junction when folded
Solution Approach 1:
The terminal portion incorporates a curved line figure at its side edge adjacent to the circuit line junction. This curvature design distributes the stress that occurs during folding, preventing stress concentration at sharp corners. The curved geometry allows stress to be dispersed along the arc, thereby maintaining both the large surface area for reliable connection and the strength to withstand folding without circuit line breakage.
2Ease of manufacture
If the angle between the side edge of terminal portion and circuit line is large to simplify manufacturing, then the manufacturing process is simplified, but the circuit line breaks when folded due to stress concentration
Solution Approach 1:
The side edge of the terminal portion is designed with a curved line figure instead of a straight edge. This curvature modification maintains manufacturing simplicity while fundamentally improving folding endurance by eliminating stress concentration points. The curved geometry naturally distributes mechanical stress during folding operations, preventing circuit line breakage without complicating the manufacturing process.
3Reliability
If the terminal portion size is large to accommodate position movement, then the connection reliability is improved, but the stress concentration at junction causes circuit line breakage when folded
Solution Approach 1:
The curved line figure at the side edge of the terminal portion addresses stress concentration by replacing sharp angular transitions with smooth curved transitions. This curvature allows stress to distribute evenly along the curved path during folding, eliminating the stress concentration that would otherwise occur at the junction between the large terminal portion and the circuit line.
Data Source
AI summary
The present invention provides an electronic circuit which comprises a circuit line and a terminal portion connected to the circuit line, wherein the terminal portion has a folding endurance structure at a junction where the terminal portion is connected to the circuit line and the folding endurance structure of the terminal portion has a plane width gradually-increasing portion, in which the width of the terminal portion in plane view increases continuously or intermittently as the folding endurance structure of the terminal portion becomes away from the junction where the terminal portion is connected to the circuit line. The electronic circuit and an IC tag incorporating the electronic circuit of the present invention are excellent in folding endurance property, and can have an electronic circuit which is hard to break even if the electronic circuit is folded.