IC Test Power Supply Switching for Multi-Voltage Chip Evaluation
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Solution Overview
Problem
Existing integrated circuit testing systems face challenges in efficiently providing varied voltage and current levels to semiconductor chips, which can affect the accuracy and reliability of testing outcomes.
Innovation Solution
A testing system incorporating a power supplying apparatus and a switch set that generates multiple voltage levels and currents, including an additional, base, and programmable voltage, with switches to distribute these to semiconductor chips, allowing precise control and testing.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a single power supplying apparatus is used to provide voltage to semiconductor chips, then the device structure is simple, but the testing capability and reliability are insufficient
Solution Approach 1:
The power supplying apparatus is segmented into multiple independent power supplying units, each capable of providing voltage to a specific semiconductor chip. This segmentation allows each unit to operate independently, improving testing reliability and capability while maintaining manageable system complexity through modular design.
Solution Approach 2:
Each power supplying unit is designed with multi-functionality to provide different voltage levels (additional voltage, base voltage, programmable voltage) to different semiconductor chips. This universal design enables a single unit to perform multiple testing functions, improving testing capability without proportionally increasing overall system complexity.
2Measurement precision
If multiple voltage levels are provided to semiconductor chips, then the testing precision is improved, but the control complexity increases
Solution Approach 1:
The power supplying units incorporate dynamic voltage control capabilities, allowing the voltage levels (additional voltage, base voltage, programmable voltage) to be adjusted in real-time based on testing requirements. This dynamic control enables precise testing of semiconductor chips under various voltage conditions while the control system adapts to different testing scenarios.
Solution Approach 2:
The system changes voltage parameters (additional voltage, base voltage, programmable voltage) to achieve different testing conditions. By systematically varying these electrical parameters, the testing precision is improved as different voltage levels reveal different aspects of semiconductor chip performance and defects.
3Measurement precision
If additional current is provided to semiconductor chips, then the detection capability is improved, but the risk of damage increases
Solution Approach 1:
The power supplying units provide additional current beyond the base operating current during testing, but only for specific measurement purposes and for limited durations. This partial excessive action enables enhanced detection capability by applying higher currents to stress-test the semiconductor chips, while the controlled and temporary nature of this excessive current minimizes damage risk.
Solution Approach 2:
The system incorporates feedback mechanisms to monitor the current applied to semiconductor chips in real-time. When additional current is applied to improve detection capability, the feedback system continuously monitors the chip response and can immediately adjust or terminate the current application if damage thresholds are approached, thus balancing detection capability with damage prevention.
Data Source
AI summary
The present application discloses a testing system for integrated circuit device, and signal source and power supplying apparatus. The signal source provides a plurality of supply voltages and a programmable voltage to a plurality of semiconductor chip groups. The signal source includes a power supplying apparatus and a switch set. The power supplying apparatus is configured to generate an additional voltage, a plurality of base voltages, and the programmable voltage. The switch set is disposed between the power supplying apparatus and the plurality of semiconductor chip groups and converts the additional voltage and the plurality of base voltages into the plurality of supply voltages.