Digital Circuit Testing TRIZ Cases
- Logic board for variable speed drive
See how resistor-based voltage differentials enable automatic logic board identification in var
- Battery Management NAND Gate Fault Detection in Test Mode
A comparator-based test mode exposes abnormal NAND gate power states in battery management modules before end-of-line defects escape.
- Optical Amplifier Inspection for High-Frequency Jitter Detection
Weak returned light is amplified without saturation, enabling linear photodetection of minute semiconductor jitter in bands up to 20 GHz.
- Back-to-Back FET ESD Pulse Generator Without Mercury Relays
Back-to-back FETs replace mercury-wetted relays to generate compliant high-voltage ESD pulses while minimizing DUT leakage currents.