Temporal Jitter Analyzer Using Delayed Reference Signal Comparison
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Solution Overview
Problem
Current technologies lack the capability to accurately measure temporal jitter of single-photon detectors with high resolution, particularly in the few-picosecond range, and require complex and expensive systems for jitter characterization.
Innovation Solution
A temporal jitter analyzer comprising a time delay controller, time delay member, delay measurement circuit, edge generator, decision circuit, and optical source, which produces a control signal, delayed primary signal, time delay measurement signal, reference signal, and decision signal to analyze temporal jitter, utilizing off-the-shelf components for high-resolution time-domain measurements.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional time-to-amplitude conversion systems or specialized integrated circuits are used for jitter measurement, then measurement precision can be achieved, but device complexity and cost increase significantly
Solution Approach 1:
The patent replaces conventional time-to-amplitude conversion systems and specialized integrated circuits with a simplified electronic circuit comprising a time delay member, delay measurement circuit, edge generator, and decision circuit. This substitution eliminates the need for complex finely-tuned conversion systems while achieving high-resolution temporal jitter measurement through standard electronic components.
Solution Approach 2:
The invention uses off-the-shelf, standard electronic components instead of expensive, specialized integrated circuits. The system employs readily available devices such as standard time delay members, comparators, and logic circuits that can be easily replaced or adjusted, significantly reducing system cost while maintaining measurement precision in the few-picosecond range.
2Measurement precision
If conventional systems are used for jitter characterization, then some measurement capability is provided, but the systems are expensive and complex
Solution Approach 1:
The patent employs universal, multi-functional electronic components that can be used for various measurement applications. The time delay member, delay measurement circuit, and decision circuit are designed to work with standard components that have multiple applications, reducing the need for specialized, single-purpose parts and thereby lowering manufacturing costs.
Solution Approach 2:
The system uses inexpensive, commercially available electronic components rather than costly specialized circuits. The design prioritizes ease of manufacture and low cost by selecting standard parts that are widely produced and easily replaceable, making high-resolution jitter measurement accessible without requiring expensive proprietary systems.
3Measurement precision
If high-resolution temporal jitter analysis is achieved, then measurement precision improves, but conventional methods require complex time-to-amplitude conversion systems
Solution Approach 1:
The patent directly replaces complex time-to-amplitude conversion systems with a simpler electronic comparison architecture. Instead of converting time intervals into amplitude variations through finely-tuned circuits, the system uses direct temporal comparison between the input signal and a delayed reference signal through standard electronic components, achieving high temporal resolution without the conversion complexity.
Solution Approach 2:
The invention extracts and eliminates the unnecessary time-to-amplitude conversion step from the measurement process. By directly comparing temporal positions of signal edges using a delay measurement circuit and decision circuit, the system achieves high-resolution jitter measurement without incorporating the complex conversion mechanism that conventional systems rely upon.
Data Source
AI summary
A temporal jitter analyzer analyzes temporal jitter and includes: a time delay controller; a time delay member; a delay measurement circuit; an edge generator in communication with the time delay member and that receives the delayed primary signal from the time delay member and produces a reference signal from the delayed primary signal; a decision circuit in communication with the edge generator and that: receives the reference signal from the edge generator; receives a detector signal; and produces a raw decision signal from the detector signal such that a value of the raw decision signal depends on the reference signal; and a decision circuit readout in communication with the edge generator and the decision circuit and that: receives the reference signal from the edge generator; receives the raw decision signal from the decision circuit; and produces a decision signal from the raw decision signal based on the reference signal.