Bimodal Solid-State Pulse Generator Replacing Mercury Relays
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Solution Overview
Problem
Conventional ESD test and pulsed I-V characterization processes are conducted on separate equipment, and toxic mercury relays used in transmission line pulse (TLP) systems pose health and environmental hazards, with limited switching cycles due to mechanical contact degradation.
Innovation Solution
A bimodal solid-state pulse generation system integrating dual-polarity ESD test and high-speed I-V characterization, utilizing bidirectional solid-state semiconductor power components to replace mercury relays, capable of generating both positive and negative pulses for ESD testing and pulsed I-V characterization.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If toxic mercury mechanical relays are used in TLP generating system, then ESD test can be conducted, but health and environmental hazards are introduced and switching cycles are limited due to mechanical contact degradation
Solution Approach 1:
The patent replaces mechanical mercury relays with solid-state semiconductor power components (such as IGBTs or MOSFETs) that have no moving parts. This substitution eliminates mechanical contact degradation, enabling unlimited switching cycles while removing toxic mercury from the system, thus resolving both the reliability and toxicity issues simultaneously.
Solution Approach 2:
The invention changes the fundamental material parameter from liquid mercury to solid-state semiconductor materials. This parameter change transforms the switching mechanism from mechanical contact to solid-state switching, achieving both enhanced durability (unlimited cycles) and elimination of toxicity.
2Adaptability or versatility
If separate equipment is used for ESD test and pulsed I-V characterization, then each test can be conducted with dedicated equipment, but system complexity increases and integration is lost
Solution Approach 1:
The patent designs a universal pulse generating system that can operate in two distinct modes: ESD test mode and pulsed I-V characterization mode. The same solid-state semiconductor power components and control architecture serve both functions, eliminating the need for separate equipment while maintaining the specialized capabilities of each test type.
Solution Approach 2:
The invention merges two previously separate test systems (ESD tester and pulsed I-V characterization system) into a single integrated platform. By combining the pulse generating circuits, control logic, and measurement capabilities into one system, it reduces overall complexity while achieving dual-mode versatility.
3Duration of action of stationary object
If conventional mercury relays are used, then ESD pulse generation is achieved, but lifespan is limited due to contact degradation upon every switching cycle
Solution Approach 1:
The patent replaces mechanical mercury relays with solid-state semiconductor power components (such as IGBTs or MOSFETs) that have no moving parts. This substitution eliminates mechanical contact degradation, enabling unlimited switching cycles while removing toxic mercury from the system, thus resolving both the reliability and toxicity issues simultaneously.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The system provides a safe, efficient, and reliable integrated solution for ESD testing and pulsed I-V characterization, with lifespans exceeding 10 billion switching cycles and fast pulse generation (≤10 ns rise and fall times), eliminating health and environmental risks while ensuring device safety and performance evaluation under real-world conditions.
Implementation Method 1
a first capacitor, and one or more first bidirectional solid-state semiconductor power components connected in series or in parallel
Implementation Method 2
the one or more first and second bidirectional solid-state semiconductor power components capable of bidirectional voltage blocking
Data Source
AI summary
Provided herewith is a new bimodal solid-state pulse generating system to generate ESD pulses for the ESD test, and narrow high-speed pulses for high-speed pulsed I-V characterization of electronic components. Accordingly, the bimodal solid-state pulse generating system is capable of operating in a dual-polarity electrostatic discharge testing mode and a pulsed I-V characterization mode respectively. In comparison with the conventional toxic mechanical mercury relay, not only is the new system display equivalent or superior performance in terms of high-speed pulse generation, but the new system also eliminates the drawbacks of the toxic mechanical mercury relays on the maximum operating cycles, and their toxicity and environmental hazard.