Photonic Circuit Testing with Multi-Passband Optical Inputs

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Solution Overview

Problem

Existing methods for testing photonic circuits on optoelectronic chips are limited in their ability to test circuits at different wavelengths and polarization modes, leading to inefficiencies and potential manufacturing disparities.

Innovation Solution

An optoelectronic chip design with optical inputs having different passbands and an optical coupling device that couples signals of specific wavelengths and polarizations to the photonic circuit, utilizing multimode interferometer and evanescent couplers to enable testing across a wide wavelength range and for various polarization modes.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If existing testing methods are used with single wavelength inputs, then the testing process is simple, but the ability to test circuits at different wavelengths and polarization modes is limited

Engineering Contradiction:

Improvetesting capability across wavelengths and polarization modesVSAvoidchip structure complexity

Core Design Contradiction:

Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The patent implements multi-functionality by providing multiple optical inputs (first optical input and second optical input) with different passbands that can test the photonic circuit at different wavelengths and polarization modes. This universal testing capability allows a single chip design to perform comprehensive testing across multiple parameters without requiring separate testing equipment or configurations.

Inventive Principle:

Principle #6Universality (Multi-functionality)

Solution Approach 2:

The patent segments the optical input interface into distinct channels (first optical input with first passband, second optical input with second passband) where each segment is optimized for specific wavelength ranges and polarization modes. This segmentation allows independent optimization of each testing channel while maintaining overall system versatility.

Inventive Principle:

Principle #1Segmentation

2Adaptability or versatility

If multiple optical inputs with different passbands are added to enable comprehensive testing, then testing versatility improves, but device complexity increases

Engineering Contradiction:

Improvetesting capabilityVSAvoidnumber of optical inputs and coupling devices

Core Design Contradiction:

Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The patent merges multiple testing functions into a unified photonic circuit structure that receives optical inputs through a integrated optical coupling device. The coupling device combines signals from multiple optical inputs with different passbands and directs them to the photonic circuit, consolidating what would otherwise require separate testing apparatus into a single integrated system.

Inventive Principle:

Principle #5Merging (Combining)

3Adaptability or versatility

If optical inputs with different passbands are used, then comprehensive wavelength and polarization testing is enabled, but manufacturing precision requirements increase

Engineering Contradiction:

Improvetesting coverageVSAvoidoptical coupling and alignment precision

Core Design Contradiction:

Adaptability or versatilityVSManufacturing precision

Solution Approach 1:

The patent applies local quality by designing each optical input with specific passband characteristics tailored to particular wavelength ranges and polarization modes. The first optical input is optimized for its specific passband while the second optical input is optimized for its different passband, allowing each component to meet precise manufacturing requirements for its designated function rather than requiring all components to meet the most stringent requirements.

Inventive Principle:

Principle #3Local quality

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach allows for comprehensive testing of photonic circuits across a wide wavelength range and multiple polarization modes, reducing manufacturing disparities and optimizing chip surface area usage.

Implementation Method 1

utilizing multimode interferometer and evanescent couplers to enable testing across a wide wavelength range and for various polarization modes

Methodology Applied

Scientific EffectEvanescent coupling:

Implementation Method 2

utilizing multimode interferometer and evanescent couplers to enable testing across a wide wavelength range and for various polarization modes

Methodology Applied

Scientific EffectMultimode interference: Interference

Data Source

PatentUS12123910B2Optoelectronic chip and method for testing photonic circuits of such chip

Publication Date: 2024.10.22 STMICROELECTRONICS (CROLLES 2) SAS

AI summary

An optoelectronic chip includes optical inputs having different passbands, a photonic circuit to be tested, and an optical coupling device configured to couple said inputs to the photonic circuit to be tested.