Image File Multi-bit Vertical Fields for Test Data Analysis
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Solution Overview
Problem
Integrated circuit testers face inefficiencies in logging and analyzing large amounts of functional test data, either by limiting data capture or using binary dumps that hinder statistical analysis.
Innovation Solution
Capturing multi-bit integer values and writing them to multi-bit vertical fields in an image file, allowing for efficient extraction and analysis, including statistical processing.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If functional test data is logged to an ASCII file with every measurement, then complete data capture is achieved, but file generation time and analysis time become excessive
Solution Approach 1:
The patent changes the data representation format from human-readable ASCII text to compact binary image file format, and organizes data in vertical fields within the image. This parameter change in data structure enables rapid writing and reading operations, reducing file generation and analysis time while preserving complete functional test data for statistical analysis
Solution Approach 2:
The patent replaces the traditional text-based ASCII logging mechanism with an image file-based storage system. By substituting the mechanical/text-based approach with an image file structure that can be efficiently processed by computing systems, the patent achieves faster data capture and analysis without sacrificing data completeness
2Ease of operation
If functional test data is logged to an ASCII file, then data can be analyzed statistically, but the large file size requires periodic pausing of test execution
Solution Approach 1:
The patent transforms the data storage parameters by using binary image file format instead of ASCII text format, and organizes numerical data in vertical fields within the image. This enables continuous test execution without periodic pausing, as the image file format allows for efficient data writing and maintains statistical analysis capability through structured vertical field organization
3Productivity
If binary dump of functional data is performed to an image file, then data generation time is reduced, but the data is not conducive to statistical analysis
Solution Approach 1:
The patent changes the organizational structure within the image file by creating vertical fields that contain numerical test data in a structured manner. Each vertical field represents a column of data that can be efficiently extracted and analyzed statistically, while maintaining the fast binary image file format for rapid data generation
Solution Approach 2:
The patent segments the image file into multiple vertical fields, where each vertical field contains organized numerical test data. This segmentation allows for efficient extraction and statistical analysis of specific data columns while maintaining the overall fast processing benefits of the image file format
Data Source
AI summary
The present disclosure is directed to numerical test data reporting using an image file and subsequent analysis of the test data. A method for capturing and analyzing test data in accordance with an embodiment includes: capturing multi-bit integer values of test data; writing each multi-bit integer value to a multi-bit vertical field in an image file; extracting the multi-bit integer values from the multi-bit vertical fields in the image file; and analyzing the extracted multi-bit integer values.