Imaging Device Deviation Detection via Reference Mark Ratio
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Solution Overview
Problem
Existing imaging devices struggle to accurately detect and calculate the actual deviation in ink landing position due to fluctuations in the distance between the imaging unit and the test pattern, leading to difficulties in locating the test pattern and calculating the actual distance of deviation in the captured image.
Innovation Solution
An imaging device with an imaging unit that captures a test pattern and a reference mark, utilizing a processor to detect the reference mark and locate the test pattern, and calculate the actual distance of deviation by determining ratios between the distances of the test pattern elements, allowing for precise adjustment of image formation parameters.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of operation
If the distance between the imaging unit and the test pattern is allowed to fluctuate, then the ease of operation is improved, but the measurement precision deteriorates
Solution Approach 1:
A reference mark is introduced as an intermediary element between the imaging unit and the test pattern. The reference mark serves as a stable reference point that allows the system to compensate for distance fluctuations. By comparing the position of test pattern marks relative to the reference mark, the system can calculate actual distances even when the overall distance between the imaging unit and test pattern varies, thus maintaining measurement precision while allowing operational flexibility.
2Reliability
If the spot diameter of the light-receiving element is increased, then the sensitivity is improved, but the measurement precision deteriorates
Solution Approach 1:
The measurement task is segmented into multiple components: the reference mark provides a stable reference point, while the test pattern marks provide measurement data. By segmenting the function between reference marking and measurement marking, the system can use larger spot diameters for better sensitivity without sacrificing precision, as the relative position calculation between segmented elements maintains accuracy even with larger detection spots.
Data Source
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AI summary
An imaging device (20; 20A; 40) includes an imaging unit (26) to obtain a captured image of a test pattern and a reference mark to locate the test pattern and at least one processor. The test pattern includes a pair of first marks and a second mark. The processor (140) includes a position detector (142) configured to detect the reference mark in the captured image and locate the pair of first marks and the second mark in the captured image, and a ratio calculator (143) configured to calculate one of a first ratio between a distance between the pair of first marks in the captured image and a deviation of the second mark in the captured image, and a second ratio between the distance between the pair of first marks in the captured image and a distance from one of the pair of first marks to the second mark in the captured image.