Imaging Device Temperature Calibration Using Single-Point Correction
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Solution Overview
Problem
The existing calibration methods for temperature sensors in imaging devices require a large number of test temperatures to achieve high accuracy, leading to increased time and equipment costs, and reducing the number of test temperatures results in lower accuracy.
Innovation Solution
An imaging device and calibration method that includes a pixel array unit, an analog signal generation unit, an A/D conversion unit, and a switch, where the analog signal is cut off and converted into digital signals to calculate correction parameters for improved accuracy without increasing the number of test temperatures.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If the number of test temperatures for calibration is increased to improve temperature sensor accuracy, then measurement precision is improved, but manufacturing cost and time consumption increase
Solution Approach 1:
The patent applies preliminary action by performing calibration at a single test temperature in advance during manufacturing, and storing the calibration parameters. This preliminary calibration eliminates the need for multiple test temperatures during actual operation, thereby improving measurement precision without increasing time consumption or manufacturing cost.
Solution Approach 2:
The patent uses copying by creating a calibration model based on data from a single test temperature, then applying this copied calibration parameters to correct temperature measurements across different operating conditions. This approach replicates the effect of multiple temperature calibrations using data from just one test temperature point.
2Measurement precision
If the number of test temperatures for calibration is increased to improve temperature sensor accuracy, then measurement precision is improved, but manufacturing cost increases
Solution Approach 1:
The patent performs calibration at a single test temperature in advance during manufacturing, storing the calibration parameters for later use. This preliminary action reduces manufacturing complexity and cost by eliminating the need for multiple test temperature setups, equipment, and associated expenses.
Solution Approach 2:
The patent changes the calibration approach from using multiple temperature parameters to using a single test temperature parameter combined with correction calculations. This parameter reduction simplifies the manufacturing process, reduces equipment requirements, and lowers overall manufacturing cost while maintaining measurement precision.
3Measurement precision
If the number of test temperatures for calibration is increased, then calibration accuracy is improved, but device complexity increases
Solution Approach 1:
The patent performs calibration at a single test temperature in advance and stores the calibration parameters in memory. This preliminary action simplifies the calibration process by eliminating the need for complex multi-temperature test setups, reducing device complexity while maintaining calibration accuracy through subsequent correction calculations.
Data Source
AI summary
An imaging device (1) according to the present disclosure includes a pixel array unit (10) that includes a pixel, an analog signal generation unit, an A/D conversion unit (23), and a switch. The analog signal generation unit generates an analog signal based on a temperature around the pixel array unit (10). The A/D conversion unit (23) converts the analog signal into a digital signal. The switch cuts off the analog signal to be supplied to the A/D conversion unit.