Thermometer With A/D Converters TRIZ Cases

A segmented resistor divider with multiplexer switching linearizes nonlinear temperature sensor output while limiting area and power.

A ratio of temperature-linked input and inverse reference voltages improves sensor accuracy while keeping A/D readout compatible with multi-sensor systems.

Different MSB and LSB determination periods speed A/D conversion while preserving accuracy for stable temperature-compensated oscillators.

Single-temperature trimming uses PTAT and CTAT currents with BIST to offset MOSFET subthreshold factor variation and improve sensor accuracy.

A resistor ladder, analog multiplexer, and comparator convert non-linear diode voltages into a linear temperature word for accurate IC sensing.

Time-division voltage-frequency conversion measures chip temperature precisely with one converter, reducing sensor area and ADC complexity.

Time-division counting converts temperature-dependent voltages into precise digital readings while keeping the sensor area compact.

Cumulative high-temperature time stored in on-chip non-volatile memory lets the IC predict wear-out and warn before failure.

A switched-capacitor reference and Sigma-Delta readout cut 1/f noise, area, and power in MEMS temperature sensing.

A delta-sigma current-sequencing scheme cancels series resistance and offset errors in remote BJT temperature sensing while cutting area and power.

A supply-based ADC reference enables ratiometric thermistor measurement, canceling voltage variation errors without calibration.

A switched-capacitor thermistor readout uses Sigma-Delta modulation and chopping to keep high-rate temperature sensing low noise and low power.

DDS-based sampling replaces analog filters in spatially resolved measurement, cutting settling time and noise for faster amplitude and phase capture.

A two-stage SAR and sigma-delta ADC cuts power and conversion burden while preserving accurate digital temperature sensing for RFID transponders.

An integrating ADC removes negative reference voltage generation in on-die thermal sensing, cutting chip complexity and current use.

A variable reference sweep shortens temperature detection time and phase lag while protecting the printer driver IC from overheating.

Internal microprocessor switches let multiple thermistors share one A/D port, cutting resistors and filter circuits while preserving temperature sensing.

PTAT and CTAT clock-based codes are compared to correct nonlinear errors and improve semiconductor temperature measurement accuracy.

Pre-amplified ΔVBE and digital curvature correction improve BJT temperature sensing accuracy while avoiding high-resolution ADC power and headroom limits.

Digital feedback corrects temperature sensor ADC errors from capacitor mismatch and OTA limits while reducing analog trim area.

Switched-capacitor differential sensing replaces resistive current paths to improve low-temperature linearity, accuracy, and power use.

An emulated temperature current enables two-point calibration at constant temperature, cutting thermal chamber cost and calibration time.

A resistor and ADC measure actual sensor currents to cancel source-ratio errors and improve BJT or diode temperature accuracy.

Sequential currents and load voltages let one bipolar transistor correct source and mismatch errors for more accurate temperature sensing.

Voltage across a series resistor lets an ADC derive current ratios and cancel source error for more reliable BJT temperature measurement.

Current-mode sensing replaces complex voltage amplification for precise temperature digitizing.

An implantable device reuses bandgap and CTAT voltage circuits with an ADC to monitor temperature without added sensor hardware.

An imaging device uses a switch to cut off analog signals for digital conversion and parameter calculation.

A level shift section adjusts analogue signal voltage to distinct ranges at a single A/D port, enabling mixed signal processing.

A temperature measuring device uses a selector to configure transistor groups for precise current output.

Ratio metric measurement cancels process variations and temperature drift in the current integrating modulator, improving temperature measurement accuracy.

A temperature sensing apparatus uses diodes and a capacitor to measure distinct thermal regions through sequential charge cycles.

A temperature sensor uses a precision band-gap circuit and sigma-delta modulator to generate precise digital output codes.

Conversion circuitry adjusts temperature resolution to enable memory systems to compensate for thermal variations during data storage operations.

Integrated circuit boards merge multiple sensors into a single system, reducing setup time while maintaining simultaneous multi-pore measurement capability.

Analog chopping and dynamic element matching filter DC errors and process variations, enabling accurate temperature measurement despite parasitic resistances.

A semiconductor storage device temperature sensor generates periodic signals to adjust applied voltages before read operations begin.

A preprocessor calculates substituted difference data from temperature sequences to identify anomalies via machine learning similarity matching.

A thermistor and resistor network with a four-switch bridge dynamically adjusts connection points to maintain measurement continuity.

A temperature sensing device calculates temperature using a ratio of zero and negative temperature coefficient voltages.

A pulse density modulation temperature sensor generates digital signals directly from transistor voltages without a reference voltage circuit.

A temperature measurement circuit uses a dummy transistor to reject common-mode process variations.

A semiconductor temperature data output circuit generates a pulse signal during power-up to activate a sensor for rapid voltage comparison.

A temperature detection device synthesizes feature amounts with past determination information to generate an identification model for accurate anomaly classification.

Phase change memory detects temperature through resistance shifts, bypassing complex calibration required by CMOS sensors.

A circuit arrangement merges multiple comparator functions into a single unit using sequential logic and digitally controlled switching elements.

Comparing independent sensor readings verifies measurement accuracy across the -40°C to 125°C range, ensuring functional safety compliance.