Temperature Sensor Circuit Using Time-Division Counting for Precision
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Solution Overview
Problem
Existing semiconductor devices face challenges in achieving high precision temperature sensing while minimizing the occupied area, as larger temperature sensors increase the size and cost of the semiconductor chip.
Innovation Solution
The implementation of a temperature sensor configuration that utilizes a reference voltage generating circuit to produce voltages with different temperature dependencies, which are then converted to frequencies and counted by counter circuits, allowing for improved precision without increasing the sensor's area through time division methods.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If the area occupied by the temperature sensor is increased to improve measurement precision, then the precision is improved, but the chip size and cost increase
Solution Approach 1:
The patent combines the temperature sensor with other functional circuits (such as ADC, voltage reference, or timing circuits) to share common structures like capacitors, resistors, or signal processing units. This integration allows the temperature sensing function to achieve high precision through shared high-precision components while reducing the total area occupied on the chip.
Solution Approach 2:
The temperature sensor is designed with a nested structure where sensing elements are placed within or alongside other functional blocks. For example, temperature-sensitive transistors are embedded within the same diffusion region as other circuit components, or the sensor occupies only a portion of an existing functional block's area, achieving high precision measurement without proportionally increasing chip area.
2Measurement precision
If the number of bits in digital information output is increased to improve precision, then the precision is improved, but the device complexity increases
Solution Approach 1:
The patent employs periodic sampling and time-division multiplexing in the ADC process, where the temperature signal is converted through periodic clock cycles. By using a time-based conversion approach with periodic operation, the system achieves high-resolution digital output through temporal separation of signal processing stages rather than through complex simultaneous multi-bit conversion circuits.
Solution Approach 2:
The patent changes the conversion parameter from direct multi-bit parallel conversion to sequential time-based conversion. By transforming the temperature signal through periodic sampling and using time as an additional dimension for resolution, the system achieves high precision digital output with simpler circuitry that operates sequentially rather than requiring complex parallel comparison circuits.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enables precise temperature measurement while maintaining a compact sensor size, enhancing the semiconductor device's performance by improving resolution without expanding its physical dimensions.
Implementation Method 1
a reference voltage generating circuit to generate first and second voltages
Implementation Method 2
a voltage-frequency converting circuit to convert the first and second voltages to a first signal having a frequency corresponding to the first voltage and a second signal having a frequency corresponding to the second voltage
Implementation Method 3
a first counter circuit to count the first signal and a second counter circuit to count the second signal
Data Source
AI summary
The present invention provides a semiconductor device having a sensor capable of improving precision while suppressing increase in occupation area. A semiconductor device has: a first counter; and a second counter (time measuring circuit) measuring time until a count value, which is obtained by counting a first signal having a frequency corresponding to a first voltage, reaches a largest count value which can be counted by the first counter. The first counter obtains a piece of digital information corresponding to the first voltage on the basis of a count value obtained by counting a second signal having a frequency corresponding to a second voltage, which is different from the first voltage, on the basis of the time measured by the time measuring circuit.