Indium-Oxide Electrode Patterning for Ultra-High-Resolution Displays

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Solution Overview

Problem

Existing electrode manufacturing technologies face challenges in achieving high resolution and efficient manufacturing processes, particularly for wearable electronic devices that require fine structures with ultra-high resolution.

Innovation Solution

The proposed electrode structure includes a first layer with a transparent conductive oxide containing indium, where the indium content varies between different areas, and is supported by a metal layer and an aluminum oxide layer. The manufacturing method involves forming a preliminary first layer, creating a photoresist pattern, and etching using hydrogen and argon plasmas to achieve the desired structure.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If a uniform indium content is used throughout the first layer, then the manufacturing process is simple, but the etching precision and pattern definition are insufficient for ultra-high resolution

Engineering Contradiction:
Improveetching precisionVSAvoidlayer structure complexity
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The first layer is designed with non-uniform indium content distribution, where the indium content varies across different regions of the layer. This local variation in material composition enables different etching rates in different areas, allowing precise pattern definition and edge sharpness required for ultra-high resolution displays while maintaining a single-layer structure.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The indium content parameter is changed spatially across the first layer, creating regions with different indium concentrations. This parameter variation allows the etching process to achieve higher precision by exploiting the differential etching rates between regions with different indium content, thereby improving pattern definition without increasing structural complexity.

Inventive Principle:
Principle #35Parameter changes

2Manufacturing precision

If conventional single plasma etching is used, then the manufacturing process is fast, but the pattern definition and edge sharpness are insufficient

Engineering Contradiction:
Improvepattern definitionVSAvoidmanufacturing efficiency
Core Design Contradiction:
Manufacturing precisionVSProductivity

Solution Approach 1:

The etching process is segmented into two distinct plasma treatment steps: a first plasma treatment that creates initial pattern definition, and a second plasma treatment that refines the pattern and sharpens edges. This segmentation of the etching process into multiple stages achieves superior pattern definition and edge sharpness while maintaining reasonable manufacturing efficiency through automated sequential processing.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The first plasma treatment performs a preliminary etching action that prepares the surface and creates initial pattern definition. This preliminary action enables the second plasma treatment to focus on refining and sharpening the patterns, thereby achieving high-quality pattern definition without requiring the second step to perform all etching functions, which improves overall process efficiency.

Inventive Principle:
Principle #10Preliminary action

3Reliability

If the first layer thickness is increased, then the conductive performance is improved, but the resolution and fine structure capability deteriorate

Engineering Contradiction:
Improveconductive performanceVSAvoidresolution
Core Design Contradiction:
ReliabilityVSManufacturing precision

Solution Approach 1:

The first layer employs non-uniform indium content distribution rather than uniform thickness increase to improve conductive performance. By concentrating indium in specific regions, the layer achieves enhanced conductivity where needed while maintaining thin overall thickness, thereby preserving the ability to form fine structures and achieve high resolution patterns.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The first layer is designed as a composite transparent conductive oxide material with spatially varying indium content. This composite structure combines regions of different indium concentrations to achieve both high conductive performance and fine structure capability, avoiding the resolution limitations that would result from simply increasing the overall layer thickness.

Inventive Principle:
Principle #40Composite materials

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enhances manufacturing efficiency and reliability while achieving high resolution, suitable for ultra-high resolution applications such as head-mounted devices with 3000 ppi or more.

Implementation Method 1

a first step of providing first plasma including hydrogen (H2) plasma on the preliminary first layer, and a second step of providing second plasma on the preliminary first layer, after the first step. The indium in the transparent conductive oxide agglomerates by the first plasma and forms an agglomeration pattern in the first step.

Methodology Applied
Scientific EffectPlasma: Plasma

Implementation Method 2

Providing the second plasma in the second step etches the agglomeration pattern.

Methodology Applied
Scientific EffectPlasma etching: Plasma

Data Source

PatentUS20250143136A1Electrode, display panel including the electrode, and method of manufacturing the electrode
Publication Date: 2025.05.01 SAMSUNG DISPLAY CO LTD
  • US20250143136A1 patent drawing
  • US20250143136A1 patent drawing
  • US20250143136A1 patent drawing

AI summary

An electrode according to an embodiment of the present disclosure includes a first layer including a transparent conductive oxide containing indium. The first layer includes a first area and a second area surrounding at least a portion of the first area. The indium content of a surface of the first layer corresponding to the first area is greater than the indium content of a surface of the first layer corresponding to the second area.