Infrared Parison Foreign Matter Detection

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Solution Overview

Problem

Conventional parison foreign matter detection systems are unable to detect foreign matter in opaque parisons.

Innovation Solution

A system utilizing infrared cameras to detect infrared rays emitted from the parison, with a determination unit comparing detection values to stored thresholds in specific areas, and a control unit to discard defective parisons, allowing for detection even in opaque conditions and preventing unnecessary defective product formation.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If a CCD camera is used to capture images of the parison for foreign matter detection, then the detection system can be implemented with conventional optical methods, but the system fails to detect foreign matter when the parison is opaque

Engineering Contradiction:
Improveforeign matter detection capabilityVSAvoidapplicability to opaque materials
Core Design Contradiction:
ReliabilityVSAdaptability or versatility

Solution Approach 1:

The patent replaces the optical detection system (CCD camera) with a thermal detection system (infrared camera). Instead of using visible light to image the parison, the system detects infrared radiation emitted by the parison itself, substituting optical mechanics with thermal field detection to overcome the opacity limitation

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The patent changes the detection parameter from visible light reflection (CCD) to infrared radiation emission (thermal imaging). By detecting the temperature distribution and infrared radiation patterns of the parison, the system can identify foreign matter through thermal anomalies even when the material is opaque to visible light

Inventive Principle:
Principle #35Parameter changes

2Reliability

If the entire parison surface is monitored for foreign matter, then comprehensive detection is achieved, but unnecessary defective products occur in areas where components will be mounted

Engineering Contradiction:
Improveforeign matter detection coverageVSAvoiddefective molded product rate
Core Design Contradiction:
ReliabilityVSLoss of substance

Solution Approach 1:

The patent applies different detection criteria and tolerance levels to different regions of the parison. By identifying areas where components will be mounted, the system adjusts detection sensitivity locally - being more stringent in critical areas and more tolerant in non-critical areas, thereby reducing unnecessary rejections while maintaining quality where it matters

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The patent divides the parison surface into multiple determination areas with different detection thresholds based on their functional importance. This segmentation allows the system to apply customized detection criteria to each region, optimizing the balance between detection sensitivity and product acceptance rate

Inventive Principle:
Principle #1Segmentation

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables the detection of foreign matter in opaque parisons, reducing the occurrence of defective products by limiting detection ranges and varying tolerance levels between areas, and facilitating the simple disposal of defective parisons.

Implementation Method 1

an infrared camera for detecting infrared rays emitted from the parison

Methodology Applied
Scientific EffectInfrared radiation: Infrared Radiation

Data Source

PatentUS10286592B2Parison foreign matter detection system
Publication Date: 2019.05.14 YACHIYO IND CO LTD
  • US10286592B2 patent drawing
  • US10286592B2 patent drawing
  • US10286592B2 patent drawing

AI summary

Some embodiments are directed to a system for detecting foreign matter in a parison discharged successively from a discharge device, the system comprising: infrared cameras that detect infrared beams emitted from the parison; and a determination unit that determines whether foreign matter is present in the parison on the basis of the infrared beams detected by the infrared cameras. A determination area is set in the parison in a discharge direction of the parison, a storage unit is provided that stores an infrared threshold set for the determination area, and the determination unit compares the detected values from the infrared cameras with the threshold.