Infrared Scratch Inspection for Transparent Conductive Films
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Existing methods struggle to accurately determine whether a scratch on a cabin window's conductive film extends beyond the top coat, necessitating a technique to assess the depth of scratches on transparent conductive films.
Innovation Solution
An inspection device and method using an infrared camera to detect infrared light transmission or reflection patterns through a transparent conductive film, determining the presence and depth of scratches based on intensity variations.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If visual inspection methods are used to detect scratches on cabin windows, then the inspection process is simple, but the detection precision is insufficient to determine whether scratches extend through the conductive film
Solution Approach 1:
The patent introduces an infrared camera as an intermediary detection device that captures infrared images of the cabin window. The infrared camera mediates between the scratch defect and the inspector, enabling precise detection of scratches through the conductive film by comparing infrared images with visible light images, thereby resolving the contradiction between detection precision and device complexity
Solution Approach 2:
The patent replaces traditional visual inspection methods with infrared imaging technology. By substituting the mechanical/optical inspection system with an infrared detection system, the patent achieves higher measurement precision for scratch detection while maintaining reasonable device complexity through the use of standard infrared camera equipment
2Loss of information
If traditional inspection methods are used, then the device complexity is low, but the ability to determine scratch depth through conductive film is insufficient
Solution Approach 1:
The patent changes the detection parameter from visible light to infrared radiation. By utilizing infrared wavelengths that can penetrate the conductive film, the system recovers lost scratch depth information without significantly increasing device complexity, as infrared cameras are standard detection equipment
Solution Approach 2:
The patent adds a new dimension of detection by introducing infrared imaging alongside or instead of visible light inspection. This dimensional change in the detection spectrum enables penetration through the conductive film layer, providing scratch depth information that was previously unavailable through conventional single-dimensional visual inspection
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Facilitates easy and accurate determination of scratches on conductive films, distinguishing between top coat and film damage.
Implementation Method 1
an infrared camera that detects the infrared light from an inspection target including a member
Data Source
AI summary
An inspection device includes an infrared acquisition unit for acquiring infrared light detected by an infrared camera for detecting infrared light from an inspection target that includes an electroconductive member, an intensity-determining unit for determining a detection intensity of the infrared light, and a scratch-determining unit for determining whether or not there is a scratch on the electroconductive member based on the detection intensity of the infrared light.