Integrated EMI Measurement for EUT Parameter Extraction
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Solution Overview
Problem
Current methods for measuring conducted emissions and characterization parameters of equipment under test (EUT) are inefficient as they require separate apparatuses, leading to interference, poor measurement accuracy, and errors due to different operating conditions, making it difficult to link these measurements effectively for modeling purposes.
Innovation Solution
A measuring apparatus comprising an arbitrary waveform generator, a coupling network, and a processing unit that simultaneously or sequentially injects test signals into the EUT's ports and measures responses to obtain conducted emissions and characterization parameters, allowing for coherent and integrated measurement of both excitation-independent and excitation-dependent parameters.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If separate apparatuses are used to measure conducted emissions and characterization parameters, then the measurement setup is simple and devices are independent, but measurement accuracy deteriorates due to interference from conducted emissions and inability to measure under same operating conditions
Solution Approach 1:
The patent combines the conducted emissions measurement unit and the characterization parameters measurement unit into a single integrated measuring apparatus. This merging allows both types of measurements to be performed simultaneously on the EUT under identical operating conditions, eliminating the interference problem and ensuring data consistency without requiring multiple separate devices.
Solution Approach 2:
The measuring apparatus is designed with multi-functional capability to perform both conducted emissions measurement and characterization parameters measurement through a single unified system. The apparatus can measure different types of parameters (emissions and electrical characteristics) using the same physical connection to the EUT, making the device universal and eliminating the need for multiple specialized instruments.
2Reliability
If separate apparatuses measure conducted emissions and characterization parameters at different times, then each measurement can be performed independently, but reliability deteriorates due to inability to link measurements to same operating conditions
Solution Approach 1:
The patent merges the measurement functions into a single apparatus that can simultaneously measure both conducted emissions and characterization parameters. This ensures that both measurements are taken under the exact same operating conditions of the EUT, providing reliable and coherent data that can be directly linked to each other for accurate modeling and filter design.
3Measurement precision
If conducted emissions interfere with characterization parameter measurements, then separate apparatuses avoid mutual interference, but measurement precision deteriorates when EUT generates emissions at measuring ports
Solution Approach 1:
The patent extracts the conducted emissions signal from the total measured signal by using the known test signals as reference. The processing unit separates the emissions component from the characterization parameters component by correlating the measured responses with the injected test signals, effectively removing the interference and recovering accurate characterization parameters even in the presence of strong emissions.
Solution Approach 2:
The patent uses the injected test signals as an intermediary reference to distinguish between the conducted emissions generated by the EUT and the test signal responses. By comparing the measured signals against the known test signals, the system can identify and separate the emissions component from the useful measurement component, eliminating mutual interference.
Data Source
AI summary
The present invention relates to a measuring apparatus, comprising: an arbitrary waveform generator to generate, and inject to a coupling network, a combination of N test signals; the coupling network to couple the N test signals to an EUT, and the responses thereof and those signals generated by the EUT itself, to a measuring unit; the measuring unit to measure the electrical signals provided by the coupling network; and—a processing unit to process the N test signals and the measured electrical signals, to obtain: the electromagnetic signals, noise or EMI generated by the EUT; and—the Z, Y or S parameters of the EUT or any other meaningful set of parameters that can be computed from the aforementioned ones or from voltages and currents. The invention also relates to a measuring method adapted to perform method steps with the apparatus of the invention.