Integrated HAC Probe for Simultaneous Field Scanning

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Solution Overview

Problem

The existing methods for measuring hearing aid compatibility (HAC) in wireless communications devices are inefficient due to the need for frequent replacement and calibration of magnetic and electric field probes, increasing measurement time.

Innovation Solution

A probe system with a circuit board mounting both magnetic and electric field detecting probes at an anti-jamming distance of at least 10 millimeters, allowing simultaneous scanning of a 50x50 mm region divided into sub-regions, reducing the need for probe replacement and calibration.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If separate electric field probe and magnetic field probe are used for scanning, then measurement accuracy is maintained, but measurement time increases due to frequent probe replacement and calibration

Engineering Contradiction:
Improvemeasurement accuracyVSAvoidmeasurement time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The patent combines separate electric field probe and magnetic field probe into a single integrated probe assembly. This allows both probes to be positioned and scanned simultaneously at predetermined locations, eliminating the need for frequent probe replacement and calibration while maintaining measurement accuracy through the integrated design.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The integrated probe is divided into distinct electric field detecting portion and magnetic field detecting portion with predetermined spacing. This segmentation allows each probe type to function independently with its own detection capabilities while being part of a unified scanning system, enabling simultaneous operation without interference.

Inventive Principle:
Principle #1Segmentation

2Reliability

If multiple probes are used for comprehensive field detection, then measurement completeness is improved, but device complexity increases

Engineering Contradiction:
Improvemeasurement completenessVSAvoidprobe system complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

Multiple probes (electric field and magnetic field) are merged into a single integrated probe assembly with a unified support structure and scanning mechanism. This reduces the number of separate devices needed while maintaining comprehensive detection capabilities through the coordinated arrangement of multiple sensing elements.

Inventive Principle:
Principle #5Merging (Combining)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enables faster and more efficient measurement of HAC by allowing both probes to operate simultaneously, significantly reducing measurement time and improving efficiency.

Implementation Method 1

an electric field detecting probe and a magnetic field detecting probe, wherein an anti jamming distance between the electric field detecting probe and the magnetic field detecting probe is a multiple of 5 millimeters and is greater than or equal to 10 millimeters

Methodology Applied
Scientific EffectElectric field detection: Electric Field

Implementation Method 2

an electric field detecting probe and a magnetic field detecting probe, wherein an anti jamming distance between the electric field detecting probe and the magnetic field detecting probe is a multiple of 5 millimeters and is greater than or equal to 10 millimeters

Methodology Applied
Scientific EffectMagnetic field detection: Magnetic Field

Data Source

PatentUS8253408B2Method for measuring hearing aid compatibility
Publication Date: 2012.08.28 HON HAI PRECISION INDUSTRY CO LTD
  • US8253408B2 patent drawing
  • US8253408B2 patent drawing
  • US8253408B2 patent drawing

AI summary

A method for measuring hearing aid compatibility (HAC) includes providing a probe and scanning testing points of a testing region obtained by the probe. The probe includes a circuit board, an electric field detecting probe, and a magnetic field detecting probe. The electric field detecting probe and the magnetic field detecting probe are located on the circuit board.