Integrated Product Reliability Testing for Mixed Failure Modes
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Solution Overview
Problem
Conventional reliability accelerated tests for products with complex component compositions yield inaccurate results due to differing types and magnitudes of influencing stresses, affecting the accuracy of reliability evaluations.
Innovation Solution
A product testing method integrating accelerated life tests and accelerated degradation tests, where components are classified into sudden failure and degradation failure types, and subjected to specific stresses in separate test boxes, allowing for accurate determination of cumulative failure probability functions and reliability assessment.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If conventional accelerated reliability tests are applied to products with complex component compositions, then the testing speed is improved, but the accuracy of reliability evaluation deteriorates due to differing types and magnitudes of influencing stresses
Solution Approach 1:
The patent segments the product into multiple components and further divides components into two categories: sudden failure components and degradation failure components. This segmentation allows each component type to be tested using the most appropriate accelerated test method (ALT for sudden failure, ADT for degradation failure), thereby resolving the contradiction between testing speed and evaluation accuracy for complex products.
Solution Approach 2:
The patent applies different test methods and stress conditions to different component types based on their specific failure characteristics. Sudden failure components receive ALT with stresses that accelerate catastrophic failures, while degradation failure components receive ADT with stresses that accelerate gradual deterioration. This localized approach ensures each component is evaluated with the most suitable method, improving overall accuracy without sacrificing testing efficiency.
2Device complexity
If a single accelerated test method is used for all components, then the testing process is simplified, but the reliability evaluation accuracy deteriorates due to ignoring different failure modes
Solution Approach 1:
The patent introduces dynamic adaptability into the testing process by automatically selecting between ALT and ADT based on component failure mode classification. The system dynamically adjusts the test method, stress type, and evaluation criteria according to whether each component is classified as sudden failure or degradation failure type, thereby maintaining high accuracy without requiring manual intervention for each component.
Solution Approach 2:
The patent changes key testing parameters (test method type, stress magnitude, stress type, evaluation metrics) based on the classified failure mode of each component. For sudden failure components, parameters are set to detect catastrophic failures quickly; for degradation failure components, parameters are adjusted to measure gradual performance deterioration. This parameter adaptation resolves the contradiction between process simplicity and evaluation accuracy.
Data Source
AI summary
The present disclosure relates to a product testing method and apparatus integrating accelerated life test and accelerated degradation test, computer device, storage medium and computer program product. The method includes, performing failure mode analysis on components of a product to be evaluated, classifying the components into sudden failure components and degradation failure components, performing accelerated life tests on the sudden failure components to determine a first cumulative failure probability function of each of the sudden failure components, performing accelerated degradation tests on the degradation failure components to determine a second cumulative failure probability function of each of the degradation failure components, and determining a reliability of the product to be evaluated based on the first cumulative failure probability function and the second cumulative failure probability function.