Interferometric Lens Aligner for Multi-Surface Optical Assembly
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Solution Overview
Problem
Existing methods for aligning optical components in multi-component optical assemblies face challenges such as limited access, mechanical contact with optical surfaces, and lateral forces, which can affect the precision and accuracy of alignment.
Innovation Solution
A method involving the detection of an optical interference pattern produced from at least three optical wave fronts, including reflections from multiple surfaces of the optical components, and computationally processing this pattern with simulated wave fronts to isolate information about the alignment of selected optical surfaces.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If dial indicators are used to align lens components on a rotating stage, then alignment information can be obtained, but mechanical contact with optical surfaces causes lateral forces that affect precision
Solution Approach 1:
The patent replaces mechanical contact-based alignment methods (dial indicators) with optical-based interferometric measurement. The system uses interferometry to detect optical path differences caused by misalignment, eliminating mechanical contact and the associated lateral forces that distort optical surfaces and reduce measurement precision.
2Object-affected harmful factors
If point source microscope with auto-collimator is used for lens alignment, then non-contact measurement is achieved, but limited access to lenses in barrel restricts applicability
Solution Approach 1:
The interferometric system is designed to be universally applicable to various optical component configurations, including lenses in barrels. The method can measure multiple surfaces (front and back of lens elements) without requiring physical access from multiple sides, as the interferometer can detect optical path differences through the entire optical assembly regardless of mounting constraints.
3Loss of information
If multiple optical surfaces are measured simultaneously, then comprehensive alignment information is obtained, but interference patterns become complex and difficult to interpret
Solution Approach 1:
The patent segments the complex interference pattern into individual contributions from each optical surface. By analyzing the specific interference characteristics (fringe patterns, path differences) associated with each surface reflection, the system can separately determine the alignment status of each surface while maintaining comprehensive measurement coverage.
Solution Approach 2:
The patent introduces computational algorithms as an intermediary between the complex interference pattern and the final alignment measurement. These algorithms process the combined interference signals from multiple surfaces, separating and analyzing each surface's contribution to extract precise alignment information that would be difficult to obtain through direct visual interpretation alone.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach allows for precise determination of the alignment of optical components, including spatial frequency distribution analysis to identify dominant peaks indicating relative alignment, and enables adjustments to achieve specified tolerance levels.
Implementation Method 1
detecting an optical interference pattern produced from a combination of at least three optical wave fronts including at least two optical wave fronts caused by reflections from at least two surfaces
Data Source
AI summary
Disclosed is a method and apparatus for determining information about an alignment of one or more optical components of a multi-component assembly involving: detecting an optical interference pattern produced from a combination of at least three optical wave fronts including at least two optical wave fronts caused by reflections from at least two surfaces of the one or more optical components; and computationally processing information derived from the detected optical interference pattern with at least one simulated optical wave front derived from a model of at least one selected optical surface of the at least two surfaces to computationally isolate information corresponding to an alignment of the selected optical surface.


