Using Optical Means TRIZ Cases
- Interferometric Encoder Spectral Analysis for Refractive Index Errors
Broadband light sources allow spectral analysis of interference patterns to minimize measurement errors from air path fluctuations.
- Vehicle Wheel Alignment Detection Device with Rotating Imaging Elements
Rotating image-acquisition elements automatically frame wheel targets, eliminating manual adjustment complexity and stereo processing requirements.
- Integrally Bonding Glass to Ceramic via Heated Contact Element
Local heating of an inserted contact element joins glass to ceramic without adhesives, preventing ageing-related component failure.
- Optical Fiber Unit Inspection Device Width Measurement
Width measurement across orthogonal directions identifies improper binding adhesion, preventing mid-span branching errors.
- Lithographic Encoder Enclosing Device for Refractive Index Stability
An encoder enclosing device isolates radiation beams from ambient fluctuations using controlled media.
- Conveyorized Object Dimensioning System With Multi-Row Light Arrays
Multi-row light emitter and receiver arrays measure object dimensions on a conveyor platform.
- Profilometer Measurement Body for 3D Position and Orientation
A polyhedral measurement body scanned by a profilometer determines three-dimensional position and orientation.
- Single Camera 3D Measurement Using Retro-Reflective Targets
A single camera and projector capture 3D positions of retro-reflective targets and surface points simultaneously.
- Optical Ranging Pixel Exposure Control for Distance Data
Optical ranging pixels adjust integration time and amplification to collect electrical charges for distance measurement.
- Partial Coherence Interferometer Null Position Ambiguity Resolution
A profilometer uses modulation frequency changes to resolve measurement position relative to a null point.
- Optical Lens Surface Measurement Using Extended Light Source
A vignetting field stop limits a measuring beam to generate blurred light spots on a spatially resolving detector for simultaneous optical lens surface analysis.
- Adjustable Ring Light Source for Interferometer Noise Reduction
Binary phase gratings and variable-focus optics generate adjustable ring light sources that suppress coherent noises from stray light reflections.
- Wafer Thickness Measurement Error Reduction via Cavity Calibration
Interferometer cavity calibration and high-order polynomial fitting determine wafer thickness variations.
- Hybrid 3D Optical Scanning for Specular Surface Metrology
A hybrid active stereo and deflectometry system captures precise 3D surface data using dual digital illuminators and cameras.
- Interferometric Lens Aligner for Multi-Surface Optical Assembly
An interferometric lens aligner detects optical interference patterns from multiple wave fronts to determine precise component alignment.
- Interferometer Disturbance Sensing for Long Haul Optical Links
First interferometer generates temporally delayed signal copies transmitted along an optical link and recombined by a second interferometer.
- Optical Position Measuring Device With Spatially Limited Reference Marking
Spatially limited reference markings generate signal drops for referencing, correcting grid errors while maintaining full measuring range availability.
- Underwater Laser Imaging for 3D Modeling
Multi-camera laser imaging generates accurate 3D models by replacing acoustic surveying methods that suffer from sound propagation limitations.
- Level Correction System for Lens Testing Machine Calibration
Laser emitter and reflective devices enable automated calibration of lens testing machine components, resolving low accuracy in manual leveling processes.
- Glass Substrate Warpage Inspection via Dynamic Conveyance
Continuous measurement during conveyance eliminates stationary positioning, reducing apparatus complexity and improving production efficiency.
- Component Holder Bearing Points for Stress-Free 3D Measurement
A component holder uses bearing points to restrict object movement without introducing mechanical stress during measurement.
- Adaptive Coordinate Measuring for Substrate Orientation
Coordinate measuring machine adapts measurement processes to substrate orientation, resolving accuracy versus complexity trade-offs through automated detection.
- Optical Encoder Photodetector Array for Contamination Resistance
Elongated spatial phase detectors arranged in a transverse sequence cancel common mode errors from contaminants and defects without complex signal processing.
- Coordinate Transformation for Virtual to Real Space Mapping
A measurement processing device transforms virtual three-dimensional coordinates into real-world latitude, longitude, and altitude data.