Time-Interleaved ADC Timing Calibration for Clock Skew Errors
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Solution Overview
Problem
Time skew errors between clock signals in analog-to-digital conversion circuits lead to data distortion and degradation in performance, particularly in time-interleaving approaches used in analog-to-digital conversion.
Innovation Solution
An analog-to-digital conversion circuit with a timing calibration circuit that includes a relative time skew generator and an absolute time skew generator, which calculates and adjusts clock signal phases to correct time skew errors using correlation values and an error calibration matrix.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Speed
If time-interleaving approach is used for fast analog-to-digital conversion, then conversion speed is improved, but time skew error between clock signals causes data distortion and performance degradation
Solution Approach 1:
The patent applies preliminary action by measuring time skew errors between clock signals before they affect the conversion process, and pre-calculating compensation values using correlation measurements. The system performs calibration operations in advance to determine skew parameters, then uses these pre-computed values to correct the clock timing relationships during normal operation, preventing data distortion before it occurs.
Solution Approach 2:
The patent implements feedback by continuously measuring the correlation between data samples from adjacent ADCs, detecting time skew errors in real-time, and using these measurements to adjust clock signal phases. The system creates a closed-loop control where conversion performance metrics feed back to the clock generator, enabling dynamic compensation that maintains high conversion accuracy despite timing variations.
2Measurement precision
If timing calibration circuit is added to correct time skew errors, then conversion accuracy is improved, but device complexity increases
Solution Approach 1:
The patent applies universality by designing the timing calibration circuit to perform multiple functions: it measures time skew errors, calculates compensation values, generates corrected clock signals, and validates conversion accuracy. The same correlation calculation unit is used for both calibration and normal conversion operations, and the clock generator serves both as a source of original clock signals and as a device for applying phase corrections based on measured skew.
Solution Approach 2:
The patent uses an intermediary approach by introducing a correlation calculation unit that acts as a mediator between the raw data samples and the time skew measurement. Instead of directly measuring clock signal timing differences, the system measures correlations in the data domain, which indirectly reveals the time skew. This intermediary measurement method simplifies the calibration circuit by avoiding direct clock signal manipulation and using readily available data samples from the conversion process.
Data Source
AI summary
An analog-to-digital conversion circuit includes analog-to-digital converters (ADCs) including a target analog-to-digital converter (ADC) providing second data samples, a first adjacent ADC providing first data samples, and a second adjacent ADC providing third data samples. The ADCs perform an analog-to-digital conversion using a time-interleaving approach in response to clock signals having different phases and including a reference clock signal. A timing calibration circuit includes a relative time skew generator generating a relative time skew and an absolute time skew generator generate an absolute time skew. A clock generator adjusts at least one phase of the clock signals based on the absolute time skew.


