Internal Node Monitoring Circuit Using a Single Test Pin
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Solution Overview
Problem
Existing electronic devices face challenges in efficiently monitoring internal nodes without requiring additional test pins and minimizing layout area.
Innovation Solution
The implementation of a power detection signal generation circuit, switch control signal generation circuit, and monitoring control circuit to connect internal nodes to a test node using power and switch control signals, allowing monitoring through a single test pin.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If traditional test methods are used to monitor internal nodes, then monitoring can be performed, but additional test pins are required which increases layout area
Solution Approach 1:
The existing test pin is made multi-functional by adding a monitoring control circuit that can switch between traditional test functions and internal node monitoring functions. The monitoring control circuit receives power detection signals and switch control signals to dynamically connect different internal nodes to the test pin, allowing a single test pin to serve multiple purposes including monitoring various internal nodes without requiring additional test pins for each monitoring function
Solution Approach 2:
The monitoring control circuit merges the functionality of multiple test pins into a single test pin by using switch control signals to dynamically connect different internal nodes to the same test pin. This consolidation eliminates the need for separate test pins for each internal node monitoring function, thereby reducing layout area while maintaining full monitoring capability
2Measurement precision
If multiple test pins are added for monitoring internal nodes, then monitoring coverage is improved, but device complexity increases
Solution Approach 1:
The test pin is enhanced with multi-functionality through the monitoring control circuit, which enables it to perform both traditional testing and internal node monitoring. The control circuit intelligently switches between functions based on power detection signals and switch control signals, allowing one test pin to replace what would traditionally require multiple dedicated pins, thus improving monitoring coverage without proportionally increasing device complexity
Solution Approach 2:
The monitoring control circuit acts as an intermediary between the test pin and multiple internal nodes. It receives switch control signals that determine which internal node should be connected to the test pin, and it manages the switching connections dynamically. This intermediary structure allows comprehensive monitoring coverage while keeping the test circuit complexity manageable by centralizing control logic in one circuit rather than requiring dedicated circuits for each node
Data Source
AI summary
An electronic device includes a power detection signal generation circuit configured to receive power to generate a power detection signal, a switch control signal generation circuit configured to generate a switch control signal when a test for monitoring internal nodes is performed, and a monitoring control circuit configured to connect one of the internal nodes to a test node, based on the power detection signal and the switch control signal, and to output a monitoring signal through the test node.