Individual Semiconductor Device Testing TRIZ Cases
- Internal Node Monitoring Circuit Using a Single Test Pin
A monitoring control circuit switches internal nodes to one test pin, enabling stable observation while reducing extra pins and layout area.
- Semiconductor Test Layout Isolation for Leakage Current Accuracy
Separating adjacent active areas and gate-linked regions cuts parasitic leakage and coupling, improving semiconductor test accuracy.
- Micro-LED Selective Transfer for Precise Pixel Alignment
Selective backplane transfer moves only exposed micro-LEDs, improving pixel alignment, yield, and source wafer reuse for dense displays.