Probe Card Double-Sided Layout for High Pin Count
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Solution Overview
Problem
Conventional probe cards are limited in accommodating a larger number of probe pins due to space constraints, leading to increased testing time and cost, and require redesigning of the test tool's securing units when trying to enhance probe pin capacity.
Innovation Solution
The probe apparatus features a modified circuit board layout with a larger size and rearranged components, allowing for a higher number of probe pins and capacitors, enabling efficient signal transmission and noise filtering without necessitating changes to the mother board or test tool design.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If the number of probe pins on the probe card is increased, then the testing efficiency and productivity are improved, but the space constraint on the probe card prevents accommodating more probe pins
Solution Approach 1:
The patent utilizes both the front surface and back surface of the circuit board to accommodate components. The pogo pads are arranged on the front surface while the probe pins are disposed on the back surface, effectively doubling the available space for component placement and enabling increased probe pin count without expanding the overall probe card footprint.
Solution Approach 2:
The circuit board is functionally segmented into two surfaces with distinct component placements. The front surface contains pogo pads for signal input, while the back surface contains probe pins for chip contact. This segmentation allows independent optimization of each surface's component layout, maximizing the total number of probe pins that can be accommodated.
2Quantity of substance
If the probe card size is enlarged to accommodate more probe pins, then the number of probe pins increases, but the securing unit of the mother board and the probe card structure require redesign
Solution Approach 1:
Instead of increasing the probe card's planar dimensions, the patent exploits the third dimension by utilizing both surfaces of the circuit board. This approach increases probe pin capacity while maintaining the same overall card size, thereby avoiding the need to redesign the securing unit and probe card structure.
3Quantity of substance
If more probe pins are added to the probe card, then the testing capacity increases, but the testing time and cost increase due to over-wear of probe pins
Solution Approach 1:
The circuit board is divided into multiple regions with pogo pads and probe pins arranged in concentric patterns. This segmentation allows for better distribution of wear across multiple contact points and enables more efficient testing workflows, reducing the overall testing time and extending the operational life of the probe pins.
Data Source
AI summary
A probe apparatus and a probe system are provided. The probe apparatus uses a larger printed circuit board to dispose a plurality of testers. The layout of each of the testers on the circuit board is modified accordingly, such that more number of the testers can be disposed on the circuit board and the pin count of the probe apparatus is increased. In addition, the probe apparatus can be installed in the test tool. Accordingly, the testing efficiency of the present test tool can be substantially promoted and the cost of the overall testing can be effectively reduced.