Test Apparatus Socket Board Miniaturization via Relay Extraction
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Solution Overview
Problem
Conventional test apparatuses face challenges in miniaturizing the socket board while maintaining precise testing of electronic devices due to issues with leakage currents from bypass capacitors and the need for relays, which complicates temperature uniformity and machine precision, and increases noise interference.
Innovation Solution
The test apparatus includes a socket board with a second bypass capacitor fixedly connected to the ground potential and a test head with a first bypass capacitor and a switch, allowing for separate management of noise reduction and leakage current minimization, enabling miniaturization and precise testing.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a relay is provided in the socket board to switch the bypass capacitor connection, then leakage current influence can be reduced during measurement, but the socket board area increases and temperature distribution uniformity deteriorates
Solution Approach 1:
The relay is extracted from the socket board and relocated to the test head. This removes the relay-related area consumption from the socket board, enabling miniaturization while preserving the ability to switch bypass capacitor connection for precise current measurement.
Solution Approach 2:
The test apparatus is segmented into functional modules: the socket board handles device mounting and fixed bypass capacitance, while the test head handles relay control and measurement switching. This segmentation allows each component to be optimized independently.
2Ease of operation
If wires for relay control and relay driving power supply are added to the socket board, then the bypass capacitor can be switched, but the socket board area increases further
Solution Approach 1:
The relay control wires and relay driving power supply wires are extracted from the socket board and relocated to the test head. This eliminates the need for additional wiring on the socket board, maintaining ease of operation through the relay while achieving miniaturization.
3Area of stationary object
If the bypass capacitor and relay are provided in the test head instead of socket board, then socket board area is reduced, but noise from power supply lines cannot be removed
Solution Approach 1:
The bypass capacitor functionality is segmented into two locations: a first bypass capacitor in the test head for noise removal from power supply lines, and a second bypass capacitor in the socket board fixedly connected for stable reference. This segmentation allows area reduction while maintaining both noise filtering and measurement precision.
Solution Approach 2:
The test head acts as an intermediary that contains the relay to control the connection of the first bypass capacitor. This intermediary structure allows the relay control wiring to be located in the test head rather than the socket board, enabling miniaturization while preserving noise removal capability.
4Productivity
If the number of electronic devices mounted on the socket board increases to improve test efficiency, then more devices can be tested simultaneously, but the region for bypass capacitor and relay becomes difficult to guarantee
Solution Approach 1:
The relay is extracted from the socket board and placed in the test head. This extraction frees up significant area on the socket board, allowing more electronic devices to be mounted simultaneously while maintaining the relay's switching functionality for precise measurement.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This configuration allows for high-precision testing of electronic devices by reducing the influence of leakage currents and noise, while enabling the miniaturization of the socket board, thus achieving compatibility between miniaturization and precise testing.
Implementation Method 1
a first bypass capacitor that is provided between the first source power transmission line and ground potential
Implementation Method 2
a second bypass capacitor that is fixedly connected between the second source power transmission line and the ground potential
Data Source
AI summary
There is provided a test apparatus that tests an electronic device. The test apparatus includes a socket board in which a socket for mounting thereon the electronic device is provided, and a test head that detachably holds the socket board and transmits source power to the electronic device via the socket board, the test head includes a first source power transmission line that transmits the source power to the socket board, a first bypass capacitor that is provided between the first source power transmission line and ground potential, and a switch that switches whether the first bypass capacitor is connected between the first source power transmission line and the ground potential, and the socket board includes a second source power transmission line that transmits the source power to the electronic device, and a second bypass capacitor that is fixedly connected between the second source power transmission line and the ground potential.