Internal Voltage Detection Circuit with Dynamic Reference Adjustment
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Solution Overview
Problem
Existing electronic devices face challenges in accurately detecting and adjusting internal voltages, such as core, boosting, and back bias voltages, which are crucial for proper operation.
Innovation Solution
An electronic device is designed with a test control circuit that generates test codes to adjust reference voltages and a test current, which is used by an internal voltage detection circuit to control the driving of internal voltages, allowing for precise adjustment of detected internal voltage levels.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If existing electronic devices use fixed reference voltages for internal voltage detection, then the device structure remains simple, but the measurement precision of internal voltage detection is insufficient
Solution Approach 1:
The patent implements dynamic adjustment of reference voltages through test control circuits that can vary reference voltage levels based on detection needs. The test control circuit generates adjustable reference voltages by combining multiple reference voltage sources with weighting coefficients, enabling the detection circuit to adapt to different internal voltage detection requirements without fixing the reference voltage to a single value.
2Measurement precision
If additional circuits are added to improve internal voltage detection accuracy, then measurement precision improves, but device complexity increases
Solution Approach 1:
The test control circuit serves multiple functions: it generates adjustable reference voltages for detection, produces test currents for calibration, and controls the overall detection process. By integrating these functions into a single control unit, the patent avoids adding separate dedicated circuits for each function, thereby improving detection accuracy while minimizing the increase in overall device complexity.
Solution Approach 2:
The patent changes the parameters of reference voltages (voltage levels, weighting coefficients) dynamically during the detection process. The test control circuit adjusts reference voltage parameters based on detection requirements, enabling high-precision detection without requiring additional hardware circuits. This parameter-based adjustment approach resolves the contradiction by achieving improved measurement precision through software/control-based parameter modification rather than hardware expansion.
Data Source
AI summary
An electronic device includes a test control circuit configured to generate test codes, configured to generate reference voltages voltage levels of which are adjusted responsive to the test codes, and configured to generate a test current the amount of which is adjusted responsive to the reference voltages and an internal voltage detection circuit configured to generate a detection signal for controlling the driving of an internal voltage by detecting the internal voltage responsive to the test current.