Integrated Circuit I/O Pin Error Detection via Toggle Test Mode
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Integrated circuits face challenges in detecting stuck or misaddressed input/output pins, particularly in analog input modes, where conventional methods are inadequate for invoking protection mechanisms effectively.
Innovation Solution
A method and circuit design that utilize resistors and a microprocessor to toggle input/output pins between input and test modes, providing a disparate value to detect errors by measuring resulting values, and using capacitors to maintain voltage levels for accurate error identification.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If conventional feedback loop methods are used to monitor output values, then some error detection capability is provided, but the method is inadequate for detecting stuck pins or misaddressing in analog input mode
Solution Approach 1:
The patent applies preliminary action by performing a test mode operation before normal operation to detect potential pin stuck or misaddressing errors. The method toggles the input/output pin to a known test state, measures the resulting value through the resistor network, and compares it against expected values to identify errors before they affect normal circuit operation. This proactive detection approach ensures reliability by preventing undetected errors from compromising system functionality.
2Reliability
If 2 channels are used to detect stuck pins or misaddressing, then protection can be invoked, but the detection method remains inadequate for analog input mode errors
Solution Approach 1:
The patent applies parameter changes by utilizing the electrical parameters of the resistor network (R1, R2, R3) to create detectable voltage variations at the input node. By toggling the input/output pin to different test states and measuring the resulting voltage changes through the resistor dividers, the method can identify pin stuck or misaddressing errors in analog input mode. This approach transforms the detection problem into a measurable electrical parameter comparison, enhancing both reliability and ease of operation.
Data Source
AI summary
A method for detecting error on an input/output (IO) pin of an integrated circuit includes using the input/output pin of the integrated circuit in a first mode by receiving or sending a first value as analog data or digital data. The input/output pin is toggled in a test mode after each instance of using the input/output pin in the first mode. The test mode includes providing a second value disparate from the first value during a set time after using the input/output pin in the first mode, receiving back during the set time a resulting value based on providing the second value, measuring the resulting value, and identifying an error on the input/output pin of the integrated circuit based on the measured resulting value.