Ion Beam Apparatus H3+ Observation Mode Switching

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Solution Overview

Problem

Current ion beam apparatuses face challenges in switching between observation and processing modes quickly due to ion current instability and sample damage from helium ions, with hydrogen ion sources offering reduced damage but larger energy width and lower resolution.

Innovation Solution

An ion beam apparatus that switches between H3+ and heavier ion beams, utilizing a gas field ionization source with specific emitter tip termination and extraction voltage control to achieve stable and focused ion beams for both observation and processing, allowing for rapid switching without sample damage.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If helium ions are used for observation, then resolution is improved, but sample damage increases

Engineering Contradiction:
Improveobservation resolutionVSAvoidsample damage
Core Design Contradiction:
Measurement precisionVSObject-affected harmful factors

Solution Approach 1:

The invention changes the ion species parameter from helium ions to H3+ ions for observation mode. H3+ ions have lower mass than helium ions, resulting in reduced sample damage while maintaining narrow energy width and high resolution through the gas field ionization source's inherent focusing capability

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The invention uses H3+ ions as a temporary substitute for helium ions during observation. The hydrogen gas is introduced into the ion source, ionized to form H3+ ions, and after use, the gas can be exhausted and replaced with heavier ions for processing mode

Inventive Principle:
Principle #27Cheap short-living objects (Disposable)

2Adaptability or versatility

If ion beam types are switched by exhausting and reintroducing gas, then ion beam switching is achieved, but switching time increases

Engineering Contradiction:
Improveion beam switching capabilityVSAvoidswitching time
Core Design Contradiction:
Adaptability or versatilityVSLoss of time

Solution Approach 1:

The invention maintains continuous operation of the ion source by keeping the gas supply system ready and using rapid valve switching to change gas flow. The ion source remains active throughout the mode transition, avoiding the need to exhaust and re-establish the ion beam from scratch

Inventive Principle:
Principle #20Continuity of useful action

Solution Approach 2:

The invention uses dynamic control of gas flow valves to switch between hydrogen gas (for H3+ observation mode) and heavier gases (for processing mode). The valve switching mechanism allows rapid transition between gas types, enabling fast mode changes while the ion source continues operating

Inventive Principle:
Principle #15Dynamics

3Loss of time

If multiple gases are introduced simultaneously into the ion source, then switching time is shortened, but ion current stability deteriorates

Engineering Contradiction:
Improveswitching timeVSAvoidion current stability
Core Design Contradiction:
Loss of timeVSReliability

Solution Approach 1:

The invention uses dynamic valve switching to control gas flow into the ion source. By rapidly opening/closing valves, the system transitions between single-gas modes (hydrogen for observation, heavier gases for processing) without maintaining simultaneous gas flow, thus preserving ion current stability while achieving fast switching

Inventive Principle:
Principle #15Dynamics

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The apparatus reduces sample damage and shortens switching time by maintaining high resolution and processable width, with H3+ ions providing improved focusing performance and reduced energy width compared to hydrogen or helium ions.

Implementation Method 1

introduce gas (ionized gas) into the vicinity of the point, field-ionize molecules of the gas, and extract the field-ionized gas molecules as an ion beam

Methodology Applied
Scientific EffectField ionization: Ionisation

Implementation Method 2

focusing an ion beam through the electromagnetic lens

Methodology Applied
Scientific EffectElectromagnetic lens focusing: Magnetic Field

Data Source

PatentUS10651006B2Ion beam apparatus
Publication Date: 2020.05.12 HITACHI HIGH TECH ANALYSIS CORP
  • US10651006B2 patent drawing
  • US10651006B2 patent drawing
  • US10651006B2 patent drawing

AI summary

According to an embodiment of the present invention, an ion beam apparatus switches between an operation mode of performing irradiation with an ion beam most including H3+ ions and an operation mode of performing irradiation with an ion beam most including ions heavier than the H3+.