Non-destructive Charged Particle Detection via Ion Cloud Perturbation
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Current methods for detecting charged particles are limited by mass range and are often destructive, making it difficult to detect particles without mass limitation and without damaging the sample.
Innovation Solution
A non-destructive detection method involving an ion cloud confined in an ion trap, where a sample is injected and crosses the ion cloud without being trapped, allowing for measurement of physical parameter perturbations to determine the presence of charged particles, with no mass limitation and enabling detection of particles up to 106 Da or more.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If FTICR mass spectrometry is used to detect charged particles, then detection resolution is improved, but mass range is limited to particles less than or equal to 10^6 Da
Solution Approach 1:
The patent introduces a reference ion cloud as an intermediary medium. Instead of directly measuring properties of individual ions across all mass ranges, the method uses a reference cloud of known ions whose collective properties (mass spectrum, ion count) serve as a benchmark. The sample cloud is compared against this reference, enabling detection of charged particles of any mass without direct measurement limitations.
Solution Approach 2:
The patent creates a reference cloud that copies the essential characteristics of ion populations (mass distribution, charge states) that can then be compared against the sample cloud. This copying approach allows the system to indirectly detect particles beyond its direct measurement capabilities by comparing against a known reference pattern.
2Productivity
If TOF mass spectrometry with electron multiplier detection is used, then detection speed is improved, but the detection process becomes destructive
Solution Approach 1:
The patent extracts the detection function from direct ion-to-detector interaction and relocates it to a comparative analysis of ion cloud properties. Instead of requiring each ion to physically strike and destroy a detector surface, the method measures collective cloud characteristics (mass spectrum, ion count) and compares them against a reference, thereby separating detection from destruction.
Solution Approach 2:
The patent replaces the mechanical impact detection system (ions physically striking semiconductor surfaces) with a field-based measurement system. The detection is achieved through electromagnetic field interactions that measure ion cloud properties without requiring physical contact, substituting mechanical destruction with non-contact field measurement and comparison.
3Force
If conventional detection methods are used for particles greater than 10^6 Da, then magnetic field requirements are reduced, but detection capability is lost
Solution Approach 1:
The patent segments the detection task into two independent comparisons: (1) comparing mass spectrum characteristics and (2) comparing ion count. This segmentation allows the system to detect particles of any mass by analyzing these separate parameters against reference values, eliminating the need for high magnetic fields that would be required to trap and detect ultra-massive particles directly.
Solution Approach 2:
The patent creates a universal detection method that functions across all mass ranges by using comparative analysis of ion cloud properties. The same reference-based comparison mechanism works for light ions, heavy ions, and ultra-massive particles, making the system universally applicable without requiring different detection mechanisms for different mass ranges.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables non-destructive detection of charged particles across all mass ranges without damaging the sample, allowing for the detection of ultra-massive particles and providing a method for single ion detection independently of the particle's nature.
Implementation Method 1
an ion cloud confined in an ion trap
Implementation Method 2
performing an injection of a sample in the ion cloud confined in the ion trap, the sample crossing the ion cloud and getting out the ion cloud without being trapped inside the ion trap
Data Source
AI summary
A non-destructive method for detecting charged particles, includes measuring a reference value of at least one physical parameter of an ion cloud confined in an ion trap; performing an injection of a sample in the ion cloud confined in the ion trap, the sample crossing the ion cloud and getting out the ion cloud without being trapped inside the ion trap; measuring a first experimental value of the at least one physical parameter of the ion cloud; and comparing the first experimental value with the reference value in order to determine the presence of at least one charged particle in the sample, or the absence of any charged particle in the sample.