Ion Deflector Shielding for Mass Spectrometer Beam Steering
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Solution Overview
Problem
Existing mass spectrometers lack flexibility in handling ions with varying mass-to-charge ratios and struggle to provide both high and low resolution mass spectra using the same instrument, leading to difficulties in precise ion beam positioning and detector alignment.
Innovation Solution
A mass spectrometer design incorporating a mass-to-charge dispersive element, an ion deflector, a shielding arrangement, and beam defining apertures, which allows individual ion beams to be steered and focused independently, enabling correction for mass or dispersion errors and improved flexibility in measuring a range of mass-to-charge ratios.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If fixed detector arrays are used with fixed spacing, then the instrument structure is simple, but the flexibility for handling ions with different mass-to-charge ratios is limited
Solution Approach 1:
The patent introduces moveable detectors that can be repositioned along the dispersive plane, transforming the fixed detector array into a dynamic configuration. This allows the detector spacing to be adjusted to match different ion beam spacings for various mass-to-charge ratios, thereby improving adaptability without requiring complete redesign of the instrument structure.
Solution Approach 2:
The detector array is divided into individually moveable detector elements rather than a rigid fixed array. Each detector can be independently positioned to optimize detection for specific ion beams, providing flexibility while maintaining a relatively simple overall structure.
2Adaptability or versatility
If zoom lens is added to adjust ion beam spacing, then the adaptability for different mass-to-charge ratios is improved, but the device complexity increases
Solution Approach 1:
The patent removes the zoom lens component from the system and replaces it with moveable detectors. This extraction of the optical element simplifies the overall device structure while achieving the same functional goal of adapting to different ion beam spacings through direct mechanical repositioning of detectors rather than optical manipulation.
3Measurement precision
If multiple deflectors are used to correct mass errors, then the measurement precision is improved, but the device complexity increases
Solution Approach 1:
The patent combines the functions of multiple deflectors into a single deflector component. By strategically positioning one deflector at a critical location in the ion path, it can correct mass errors for multiple ion beams simultaneously, achieving the same measurement precision improvement without the complexity of multiple separate deflector systems.
4Measurement precision
If precise aperture alignment is required for high resolution, then the measurement precision is improved, but the ease of operation deteriorates
Solution Approach 1:
The patent employs moveable detectors that can be dynamically repositioned to maintain optimal alignment with ion beams across different mass-to-charge ratios. This dynamic adjustment capability allows the system to achieve high resolution measurements without requiring precise fixed aperture alignment, as the detectors can adapt their positions to accommodate variations in ion beam spacing.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This design enhances the mass spectrometer's ability to measure a wider range of mass-to-charge ratios with reduced requirements for detector positioning, allowing for different operation modes and improved diagnostic capabilities, including high and low resolution measurements without the need for precise aperture alignment.
Implementation Method 1
a mass-to-charge dispersive element, the mass analyzer being arranged to receive ions, to separate the ions according to their mass-to-charge ratios along a dispersive plane
Implementation Method 2
an ion deflector, arranged downstream from the dispersive element to deflect ions leaving the mass analyzer in the dispersive plane
Data Source
AI summary
A mass spectrometer is disclosed having a mass analyzer with a mass-to-charge dispersive element for separating ions according to their mass-to-charge ratios along a dispersive plane and an ion deflector to deflect ions leaving the mass analyzer in the dispersive plane. A shielding arrangement, located between the dispersive element and the ion deflector is arranged to define the portion of the beam to be deflected by the ion deflector. The deflected beam is steered onto a beam defining aperture, located at the focal plane of the mass analyzer is detected by at least one ion detector, located downstream from the beam defining aperture.