Ion Detector Electron Impact Diode Staggered Anode Design

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Solution Overview

Problem

Existing ion detectors face challenges in reliably ensuring total gain due to difficulties in including effective regions of electron impact-type diodes within the focusing diameter of secondary electrons, leading to potential issues with detection accuracy and dynamic range expansion.

Innovation Solution

The ion detector design includes a microchannel plate generating secondary electrons, a focus electrode to focus these electrons, and a plurality of electron impact-type diodes with narrower effective regions disposed closer to each other, allowing their effective regions to be within the focusing diameter, along with a cover and voltage supply system to manage gain and prevent charging, enabling reliable total gain and dynamic range expansion.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If two flat plate-shaped anodes are provided in parallel on the same plane, then the dynamic range is expanded, but it becomes difficult to reliably ensure total gain because the effective regions cannot be included within the focusing diameter of secondary electrons

Engineering Contradiction:
Improvedynamic rangeVSAvoidtotal gain
Core Design Contradiction:
Adaptability or versatilityVSReliability

Solution Approach 1:

The patent transitions from a two-dimensional parallel arrangement of anodes on the same plane to a three-dimensional staggered arrangement where anodes are positioned at different depths along the electron trajectory. This dimensional change allows the effective regions of multiple anodes to be sequentially included within the focusing diameter of secondary electrons while maintaining expanded dynamic range capability

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The patent implements a nested configuration where multiple anode effective regions are arranged concentrically along the electron path, with each subsequent anode positioned within the focusing diameter of previous anodes. This nesting ensures that all effective regions are reliably included within the focused electron beam while maintaining the ability to detect across a wide dynamic range

Inventive Principle:
Principle #7Nested doll (Nesting)

2Device complexity

If the effective regions of electron impact-type diodes are disposed farther apart to avoid overlap, then device complexity is reduced, but detection accuracy deteriorates because the total gain cannot be reliably ensured

Engineering Contradiction:
Improvearrangement complexityVSAvoiddetection accuracy
Core Design Contradiction:
Device complexityVSMeasurement precision

Solution Approach 1:

The patent resolves the conflict between simplicity and accuracy by moving from a simple two-dimensional layout to a controlled three-dimensional arrangement. The staggered positioning along the electron trajectory enables precise spatial control of effective regions, ensuring they fall within the focusing diameter without requiring complex overlapping configurations

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

3Reliability

If the focusing diameter of secondary electrons is significantly increased to include multiple effective regions, then all effective regions can be included, but the device complexity increases and the focusing precision is reduced

Engineering Contradiction:
Improvetotal gainVSAvoidfocusing system complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent divides the detection function across multiple segmented anodes positioned at different locations along the electron trajectory. Each anode handles a specific portion of the electron flux, eliminating the need for a single large focusing diameter while ensuring reliable total gain through the combined response of multiple smaller, precisely-positioned detection regions

Inventive Principle:
Principle #1Segmentation

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This configuration ensures reliable total gain and expands the dynamic range by allowing effective regions of electron impact-type diodes to be focused within a narrower range, improving detection accuracy and handling varying ion counts effectively.

Implementation Method 1

a microchannel plate configured to generate secondary electrons upon reception of ions incident thereon and multiply and output the generated secondary electrons

Methodology Applied
Scientific EffectSecondary electron emission: Photoelectric Effect

Implementation Method 2

a focus electrode disposed between the microchannel plate and the electron impact-type diodes and configured to focus the secondary electrons toward the electron impact-type diodes

Methodology Applied
Scientific EffectElectron focusing: Electrostatic Lens

Implementation Method 3

a plurality of electron impact-type diodes having effective regions narrower than an effective region of the microchannel plate on an electron incident surface facing the microchannel plate side, configured to receive the incident secondary electrons output from the microchannel plate, and multiply and detect the incident secondary electrons

Methodology Applied
Scientific EffectElectron impact multiplication: Electron Avalanche

Data Source

PatentUS11521841B2Ion detector having electron impact-type diode configuration
Publication Date: 2022.12.06 HAMAMATSU PHOTONICS KK
  • US11521841B2 patent drawing
  • US11521841B2 patent drawing
  • US11521841B2 patent drawing

AI summary

An ion detector includes a microchannel plate configured to generate secondary electrons upon reception of ions incident thereon and multiply and output the generated secondary electrons; a plurality of electron impact-type diodes configured to have effective regions narrower than an effective region of the microchannel plate on an electron incident surface facing the microchannel plate side, receive the incident secondary electrons output from the microchannel plate, and multiply and detect the incident secondary electrons; and a focus electrode configured to be disposed between the microchannel plate and the electron impact-type diodes and focus the secondary electrons toward the electron impact-type diode.