Ion Source Curtain Gas Flow for Low-Residue Mass Spectrometry
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Solution Overview
Problem
In mass spectrometers, sample solution residue inside the ion source container leads to reduced analysis accuracy, erroneous detections, increased maintenance costs, and decreased throughput due to sample adhesion and contamination, which existing technologies do not adequately address.
Innovation Solution
A second gas, referred to as the curtain gas, is supplied along the inner wall of the ion source container to prevent circulation flows and promote smooth sample discharge, reducing adhesion and residue accumulation.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If sample solution is not smoothly discharged from the ion source, then sample remains in the ion source for a long time, but analysis accuracy is reduced and erroneous detections occur
Solution Approach 1:
The patent extracts the harmful circulation flow from the ion source by introducing a second gas flow that opposes the vortex formation. The second gas flows from the ionization region toward the exhaust unit, carrying sample solution residues out of the ion source before they can adhere to surfaces or cause contamination in downstream components.
Solution Approach 2:
The second gas acts as an intermediary substance that mediates between the sample solution discharge process and the vacuum system. It serves as a transport medium to carry residues from the ionization region to the exhaust, preventing direct contact between sample residues and critical components like the ion lens.
2Quantity of substance
If sample remains in the ion source for a long time, then sample adheres to wall surfaces and ion lens, but maintenance cycle is shortened and throughput decreases
Solution Approach 1:
The patent applies preliminary action by introducing the second gas flow to prevent sample adhesion before it occurs. The continuous flow of second gas from the ionization region toward the exhaust unit proactively removes sample residues, preventing their accumulation on wall surfaces and downstream components before maintenance would be required.
3Ease of manufacture
If sample adheres to ion source wall surface and ion lens, then maintenance cost increases and throughput decreases
Solution Approach 1:
The patent extracts sample residues from the ion source environment before they can adhere to critical components. By introducing the second gas flow that carries residues toward the exhaust unit, the system prevents contamination of the ion lens and wall surfaces, thereby extending maintenance intervals and maintaining high throughput without increasing maintenance costs.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enhances analysis accuracy, improves signal-to-noise ratios, reduces erroneous detections, extends maintenance cycles, and increases processing throughput by minimizing sample adhesion and residue within the ion source and downstream components.
Implementation Method 1
a second gas flowing toward an exhaust unit along an inner wall of the ion source container is supplied inside the ion source container
Implementation Method 2
a flow of the second gas (flow of a curtain gas) along a wall surface of the ion source container is generated
Implementation Method 3
Ionization by an electrospray ionization (ESI) method is performed in the following procedure. A sample solution flows through a capillary to which a high voltage is applied, a sample is ejected from a tip end of the capillary, heated gas is blown from a periphery, and the sample solution is sprayed to generate charged droplets
Implementation Method 4
When the charged droplets are evaporated and split, ions are generated
Implementation Method 5
heated gas is blown from a periphery
Implementation Method 6
the ions are drawn in a low vacuum vacuumed by a vacuum pump by an electric field or the like
Implementation Method 7
A high frequency voltage and a DC voltage are applied to these metal rods, and specific ions are separated by passing only those having a ratio m/z of a mass (m) and an electric charge (z) of the specific ions
Data Source
AI summary
An object of the invention is to provide a mass spectrometer capable of preventing a sample from remaining inside an ion source container for a long time. In the mass spectrometer according to the invention, in addition to a first gas used for ionizing an ion source, a second gas flowing toward an exhaust unit along an inner wall of the ion source container is supplied inside the ion source container (see FIG. 1).