Ion Source Magnetic Field Sources for Uniform Beam

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Solution Overview

Problem

Ion implanters face challenges in achieving uniform ion density profiles, especially when using ion sources with extraction apertures greater than 100 mm, which affects the uniformity of the ion beam implanted across larger substrates like 450 mm wafers, due to non-uniformity issues and space-charge loading during beam transport.

Innovation Solution

The use of a pair of magnetic field sources with cores and coils, aligned parallel to the longitudinal axis of the ionization chamber, and independently controlled coil segments to produce a uniform magnetic field, ensuring a consistent ion density profile along the beam's longitudinal axis, is employed to address the non-uniformity issues.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Length of moving object

If conventional ion sources with large extraction apertures (>100 mm) are used to produce extended ribbon beams for large substrates, then the beam length and coverage area are improved, but the ion density uniformity deteriorates

Engineering Contradiction:
Improveribbon beam lengthVSAvoidion density uniformity
Core Design Contradiction:
Length of moving objectVSManufacturing precision

Solution Approach 1:

The ion source is divided into multiple independently controllable cathode segments along the longitudinal axis. Each cathode segment can be controlled to emit different ion currents, allowing the ion density profile to be adjusted and equalized across the entire extraction aperture. This segmentation enables uniform ion density distribution while maintaining large beam length for extended substrate coverage.

Inventive Principle:
Principle #1Segmentation

2Manufacturing precision

If multiple cathodes are used to improve ion density uniformity, then the ion density profile control is improved, but the device complexity increases

Engineering Contradiction:
Improveion density profile uniformityVSAvoidnumber of cathodes and gas lines
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The cathode is segmented into multiple independently controllable sections along the longitudinal axis, with each section having its own emission control. This allows localized adjustment of ion density without requiring separate complete cathode assemblies, reducing complexity compared to using multiple full cathodes.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Different regions of the cathode are given different emission characteristics to compensate for non-uniform ion density. By controlling each segment's emission independently, the ion density can be equalized across the extraction aperture without adding complex overall system architecture.

Inventive Principle:
Principle #3Local quality

3Manufacturing precision

If corrector optics are added to the beam line to adjust ion density profile, then the beam uniformity can be improved, but the device complexity and space-charge loading increase

Engineering Contradiction:
Improvebeam uniformityVSAvoidbeam line optics
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The ion density profile is equalized at the source before beam extraction and transport. By controlling cathode segment emissions to produce uniform ion density at the aperture, the beam exits with uniform density, eliminating the need for downstream corrector optics to adjust the profile during transport.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The function of profile correction is extracted from the beam transport system and moved to the ion source itself. Instead of using corrector optics in the beam line, the source is designed to produce the correct profile directly, simplifying the overall system by removing unnecessary correction components.

Inventive Principle:
Principle #2Taking out (Extraction)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This configuration enables the generation of a uniform ion beam with a ribbon extent suitable for 300-mm or 450-mm substrates, maintaining beam dimensions during transport and ensuring high dose rates by reducing space charge blowup, thus improving the uniformity of ion implantation across the substrate.

Implementation Method 1

a magnetic field source assembly adapted to produce a magnetic field within the ion source structure

Methodology Applied
Scientific EffectMagnetic field: Magnetic Field

Implementation Method 2

an electromagnetic coil assembly (604a-b) generally wound around the core (602a-b)

Methodology Applied
Scientific EffectElectromagnetic induction: Electromagnetic Induction

Implementation Method 3

The magnetic field is adapted to confine the electron beam generated by each of the electron guns

Methodology Applied
Scientific EffectLorentz force: Lorentz Force

Data Source

PatentUS9275819B2Magnetic field sources for an ion source
Publication Date: 2016.03.01 NISSIN ION EQUIPMENT CO LTD
  • US9275819B2 patent drawing
  • US9275819B2 patent drawing
  • US9275819B2 patent drawing

AI summary

An ion source is provided that includes an ionization chamber and two magnetic field sources. The ionization chamber has a longitudinal axis extending therethrough and includes two opposing chamber walls, each chamber wall being parallel to the longitudinal axis. The two magnetic field sources each comprises (i) a core and (ii) a coil wound substantially around the core. Each magnetic field source is aligned with and adjacent to an external surface of respective one of the opposing chamber walls and oriented substantially parallel to the longitudinal axis. The cores of the magnetic field sources are physically separated and electrically isolated from each other.